公开(公告)号：WO2012104505A8

公开(公告)日：2013-09-19

申请号：PCT/FR2012000040

申请日：2012-01-31

Applicant: UNIV MONTPELLIER II ,  ARINERO RICHARD ,  MEKKI JULIEN ,  TOUBOUL ANTOINE ,  SAIGNE FREDERIC ,  VAILLE JEAN-ROCH

Inventor： ARINERO RICHARD ,  MEKKI JULIEN ,  TOUBOUL ANTOINE ,  SAIGNE FREDERIC ,  VAILLE JEAN-ROCH

IPC: G01T1/02

CPC classification number: G01T1/026

Abstract: A method of measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element furnished with an electrode made of a semiconducting material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects on the basis of the measurement of capacitance of the capacitive element in the accumulation regime.

Abstract translation: 测量与颗粒辐射的非电离效应有关的剂量的方法包括：照射具有由半导体材料制成的电极的电容元件，电容元件在积聚状态下的电容的测量和 基于在积聚状态下的电容元件的电容的测量，确定与非电离效应相关的剂量。