Abstract:
The present invention relates to a control system configured to control a parameter (F) of a dynamic system, wherein the parameter depends on an output signal (g(F(k))). The control system comprises a set-point generator and a feedforward, wherein the set-point generator is arranged to provide a set-point signal (F(k)) to the feedforward. The feedforward is arranged to provide the output signal based on the set-point signal, wherein the feedforward is arranged to perform a non-linear operation on the set-point signal. The non-linear operation is based on a non-linear functional relationship between the output signal and the parameter.
Abstract:
The invention provides a support (1) comprising: • - a first end portion (2) and a second end portion (3) wherein the second end portion (3) is on the side opposite to the first end portion (2) in a longitudinal direction of the support, • - a coil spring (4) which is arranged between the first end portion (2) and the second end portion (3) which coil spring (4) comprises: • - a first spiral member (5) which extends between the first end portion (2) and the second end portion (3) in a circumferential direction of the support (1), and • - a second spiral member (6) which extends between the first end portion (2) and the second end portion (3) in a circumferential direction of the support (1), wherein the first spiral member (5) of the coil spring and the second spiral member (6) of the coil spring (4) are moveable relative to each other, wherein the support (1) further comprises a damper device (20) which is attached to the first spiral member (5).
Abstract:
A lithographic apparatus comprising a projection system configured to project a patterned radiation beam to form an exposure area on a substrate held on a substrate table, the lithographic apparatus further comprising a cooling apparatus for cooling the substrate, wherein the cooling apparatus comprises a cooling element located above the substrate table and adjacent to the exposure area, the cooling element being configured to remove heat from the substrate.
Abstract:
A lithographic apparatus comprising a support structure constructed to support a patterning device and associated pellicle, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, and a projection system configured to project the patterned radiation beam onto a target portion of a substrate, wherein the support structure is located in a housing and wherein pressure sensors are located in the housing.