MASK ASSEMBLY AND ASSOCIATED METHODS
    2.
    发明申请
    MASK ASSEMBLY AND ASSOCIATED METHODS 审中-公开
    面罩组件和相关方法

    公开(公告)号:WO2016124536A3

    公开(公告)日:2016-10-06

    申请号:PCT/EP2016052055

    申请日:2016-02-01

    CPC classification number: G03F1/62 G03F1/66 G03F1/84

    Abstract: A method comprising the steps of receiving a mask assembly comprising a mask and a removable EUV transparent pellicle held by a pellicle frame, removing the pellicle frame and EUV transparent pellicle from the mask, using an inspection tool to inspect the mask pattern on the mask, and subsequently attaching to the mask an EUV transparent pellicle held by a pellicle frame. The method may also comprise the following steps: after removing the pellicle frame and EUV transparent pellicle from the mask, attaching to the mask an alternative pellicle frame holding an alternative pellicle formed from a material which is substantially transparent to an inspection beam of the inspection tool; and after using an inspection tool to inspect the mask pattern on the mask, removing the alternative pellicle held by the alternative pellicle frame from the mask in order to attach to the mask the EUV transparent pellicle held by the pellicle frame.

    Abstract translation: 一种方法,包括以下步骤:接收包括掩模和由薄膜框架保持的可移除EUV透明薄膜的掩模组件,使用检查工具从掩模移除薄膜框架和EUV透明薄膜,以检查掩模上的掩模图案, 随后将由EUV透明薄膜保持在薄膜框架上的面罩附着在面罩上。 所述方法还可以包括以下步骤:在从所述掩模移除所述薄膜框架和所述EUV透明薄膜之后,将替代的薄膜框架附接到所述掩模,所述薄膜框架保持由对所述检查工具的检查梁基本上透明的材料形成的替代薄膜 ; 并且在使用检查工具检查掩模上的掩模图案之后,从掩模去除由替代薄膜框架保持的替代薄膜,以便将由薄膜框架保持的EUV透明薄膜附着到掩模。

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