公开(公告)号：WO2013171555A1

公开(公告)日：2013-11-21

申请号：PCT/IB2013000729

申请日：2013-04-19

Applicant: DH TECHNOLOGIES DEV PTE LTD

Inventor： COLLINGS BRUCE ANDREW ,  DIMA MARTIAN ,  IVOSEV GORDANA

IPC: H01J49/26

CPC classification number: H01J49/0027 ,  G01T1/171 ,  H01J49/0009 ,  H01J49/0036 ,  H01J49/025

Abstract: Systems and methods are provided to perform dead time correction. An observed ion count rate is obtained using a non-paralyzable detection system of a mass spectrometer. The detection system includes an ion detector, a comparator/discriminator, a mono-stable circuit and a counter. The non- paralyzable detection system exhibits dead time extension at high count rates. The extension of the dead time occurs because the mono-stable circuit requires a rising edge to trigger and can only be triggered again after the output pulse from the comparator/discriminator has gone low. This allows a second comparator/discriminator pulse arriving just before the end of the dead time started by a first comparator/discriminator pulse to extend the dead time to the trailing edge of the second comparator/discriminator pulse. A true ion count rate is calculated by performing dead time correction of the observed ion count rate.

Abstract translation: 提供系统和方法来执行死区时间校正。 使用质谱仪的非可分离检测系统获得观察到的离子计数率。 检测系统包括离子检测器，比较器/鉴别器，单稳态电路和计数器。 非可分析检测系统以高计数率显示死区时间延长。 由于单稳态电路需要上升沿触发，只能在比较器/鉴位器的输出脉冲变低后再次触发，才会延长死区时间。 这允许在由第一比较器/鉴频器脉冲开始的死区时间结束之前到达第二比较器/鉴频器脉冲，从而将死区时间延长到第二比较器/鉴频器脉冲的后沿。 通过对观察到的离子计数率执行死区时间校正来计算真实的离子计数率。