COUNT UNIFORMITY CORRECTION IN FLUX SPACE FOR PIXILATED SEMICONDUCTING RADIATION DETECTORS
    1.
    发明申请
    COUNT UNIFORMITY CORRECTION IN FLUX SPACE FOR PIXILATED SEMICONDUCTING RADIATION DETECTORS 审中-公开
    用于有源半导体辐射探测器的通量空间中的均匀校正

    公开(公告)号:WO2007109029A3

    公开(公告)日:2008-04-17

    申请号:PCT/US2007006351

    申请日:2007-03-13

    Inventor: BALE DEREK S

    CPC classification number: H04N5/32 H04N5/365 H04N5/367

    Abstract: In operation of a photon counting detecting system (10), a number of pulse counts output by least one pixel (20) of a photon counting detector in response to experiencing a photon flux density during a sample interval is acquired and a photon flux density (46) or value related thereto corresponding to the pulse counts output by the pixel (20) is determined. A correction (48) for the thus determined photon flux density (46) or value related thereto is determined. A corrected number of pulse counts (52) is determined for the pixel (20) as a function of the thus determined corrected photon flux density value or value related thereto. An image can be displayed that is a function of the corrected number of pulse counts for pixels of the system.

    Abstract translation: 在光子计数检测系统(10)的操作中,获取响应于在采样间隔期间经受光子通量密度而输出光子计数检测器的至少一个像素(20)的脉冲计数,并且获得光子通量密度( 46)或与像素(20)输出的脉冲计数相关的值。 确定如此确定的光子通量密度(46)或与其相关的值的校正(48)。 根据如此确定的校正光子通量密度值或与其相关的值,为像素(20)确定校正数量的脉冲计数(52)。 可以显示与系统的像素的校正的脉冲计数数的函数的图像。

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