HIGH POWER LASER DIODE TEST SYSTEM AND METHOD OF MANUFACTURE
    1.
    发明申请
    HIGH POWER LASER DIODE TEST SYSTEM AND METHOD OF MANUFACTURE 审中-公开
    高功率激光二极管测试系统和制造方法

    公开(公告)号:WO2017075557A1

    公开(公告)日:2017-05-04

    申请号:PCT/US2016/059618

    申请日:2016-10-29

    CPC classification number: G01R31/2875 G01R31/2635 H01S5/0014

    Abstract: A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device test module compartment, a device test module having at least one carrier device receiver formed therein detachably coupled to the housing body, and at least one carrier device configured to support at least one laser diode device coupled thereto detachably positioned within the carrier device port formed on the device test module.

    Abstract translation: 公开了一种高功率激光二极管测试系统,其包括在其中限定至少一个设备测试模块隔间的壳体,电源,系统控制器和位于设备测试模块内的热控制系统 隔室,具有形成在装置测试模块的至少一个载流子器件接收器在其中可拆卸地联接到所述外壳主体,以及至少一种载体装置,被配置为支持耦合到其可拆卸地定位在器件上形成的承载设备端口中的至少一个激光二极管器件 测试模块。

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