PROCESS TOLERANT CURRENT LEAKAGE REDUCTION IN STATIC RANDOM ACCESS MEMORY (SRAM) BY A SUPPLY VOLTAGE BIAS CIRCUIT
    1.
    发明申请
    PROCESS TOLERANT CURRENT LEAKAGE REDUCTION IN STATIC RANDOM ACCESS MEMORY (SRAM) BY A SUPPLY VOLTAGE BIAS CIRCUIT 审中-公开
    通过供电电压偏置电路在静态随机存取存储器(SRAM)中进行容错电流泄漏减少

    公开(公告)号:WO2015089472A1

    公开(公告)日:2015-06-18

    申请号:PCT/US2014/070149

    申请日:2014-12-12

    CPC classification number: G11C11/417 G11C5/148 G11C7/12

    Abstract: A memory device biasing circuit is disclosed, the circuit having a pair of semiconductor devices coupled to receive a supply voltage having a supply voltage level suitable for operating a memory device in an active mode and operable for providing an adjustable biased voltage to the memory device that is greater than a minimal voltage level for operating the memory device in a data retention mode. The pair of semiconductor devices includes a first semiconductor device; and, a second semiconductor device that includes an opposite type of semiconductor device than the first semiconductor device such that the pair of semiconductor devices includes each of an N-type semiconductor device and a P-type semiconductor device. The memory device biasing circuit further includes a bias adjustment circuit coupled to the second semiconductor device and configured to adjust the operation of the second semiconductor device based on the supply voltage.

    Abstract translation: 公开了一种存储器件偏置电路,该电路具有一对半导体器件,其被耦合以接收电源电压,该电源电压具有适于在有源模式下操作存储器件的电源电压电平,并可操作以向存储器件提供可调节的偏置电压, 大于在数据保持模式下操作存储器件的最小电压电平。 所述一对半导体器件包括第一半导体器件; 以及包括与第一半导体器件相反的半导体器件的第二半导体器件,使得该对半导体器件包括N型半导体器件和P型半导体器件中的每一个。 存储器件偏置电路还包括耦合到第二半导体器件并被配置为基于电源电压来调整第二半导体器件的操作的偏置调整电路。

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