INCREASING THE MEASUREMENT PRECISION OF OPTICAL INSTRUMENTATION USING KALMAN-TYPE FILTERS

    公开(公告)号:WO2022170418A1

    公开(公告)日:2022-08-18

    申请号:PCT/CA2022/050139

    申请日:2022-02-01

    Abstract: In a general aspect, a method is presented for increasing the measurement precision of an optical instrument. The method includes determining, based on optical data and environmental data, a measured value of an optical property measured by the optical instrument. The optical instrument includes an optical path and a sensor configured to measure an environmental parameter. The method also includes determining a predicted value of the optical property based on a model representing time evolution of the optical instrument. The method additionally includes calculating an effective value of the optical property based on the measured value, the predicted value, and a Kalman gain. The Kalman gain is based on respective uncertainties in the measured and predicted values and defines a relative weighting of the measured and predicted values in the effective value.

    HOUSING AN ETALON IN A FREQUENCY REFERENCE SYSTEM

    公开(公告)号:WO2022165582A1

    公开(公告)日:2022-08-11

    申请号:PCT/CA2021/050716

    申请日:2021-05-27

    Abstract: In a general aspect, a device is disclosed for providing a reference frequency of light. The device includes a housing having a first opening and a second opening. A first optical window covers the first opening and is coupled to the housing by a first ceramic bond that forms a hermetic seal around the first opening. A second optical window covers the second opening and is coupled to the housing by a second ceramic bond that forms a hermetic seal around the second opening. The device also includes an etalon disposed within an evacuated volume enclosed by at least the housing, the first optical window, and the second optical window. The device additionally includes one or more supports suspending the etalon in the evacuated volume. The one or more supports are formed of a material having a thermal conductivity no greater than 5 W/m·K at room temperature.

    MEASURING WAVELENGTH OF LIGHT
    3.
    发明申请

    公开(公告)号:WO2021258184A1

    公开(公告)日:2021-12-30

    申请号:PCT/CA2020/051749

    申请日:2020-12-18

    Abstract: In a general aspect, a wavelength of light is measured. In some aspects, a wavelength measurement system includes an interferometer, a camera system, a sensor and a control system. The interferometer includes two reflective surfaces and a transmission medium between the two reflective surfaces. The interferometer is configured to receive an optical signal from a laser and produce an interferogram in response. The camera system is configured to receive the interferogram from the interferometer and generate interferogram data in response. The interferogram data represents the interferogram received from the interferometer. The sensor is configured to sense an environmental parameter of the transmission medium and generate sensor data in response. The control system is configured to perform operations including, receiving the interferogram data from the camera system and the sensor data from the sensor; and computing a wavelength of the laser based on the interferogram data and the sensor data.

    SINGLE PIXEL IMAGING OF ELECTROMAGNETIC FIELDS

    公开(公告)号:WO2021119799A1

    公开(公告)日:2021-06-24

    申请号:PCT/CA2020/051031

    申请日:2020-07-28

    Abstract: In a general aspect, an imaging method is presented that includes receiving, at a vapor-cell sensor, input optical signals and electromagnetic radiation from at least a test device to generate an output optical signal. The output optical signal is processed at a single pixel camera to generate camera output data. An image of the electromagnetic radiation is constructed by operation of a computer system based on the camera output data. In some implementations, the single pixel camera includes a patterned light generator and a photodetector. In these implementations, the imaging method includes receiving, at the photodetector, patterned instances of the output optical signal generated by the patterned light generator. Each patterned instance represents a respective portion of the image of the electromagnetic radiation. Moreover, the intensity of each patterned instance may be measured, by operation of at least the photodetector, to generate the camera output data.

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