公开(公告)号：WO2011156040A3

公开(公告)日：2014-03-27

申请号：PCT/US2011028886

申请日：2011-03-17

Applicant: THERMAL WAVE IMAGING INC ,  SHEPARD STEVEN M ,  LHOTA JAMES R ,  AHMED TASDIQ ,  CHAUDHRY BHARAT BHUSHAN

Inventor： SHEPARD STEVEN M ,  LHOTA JAMES R ,  AHMED TASDIQ ,  CHAUDHRY BHARAT BHUSHAN

IPC: G01K13/02

CPC classification number: F01D5/187 ,  F01D5/186 ,  F01D21/003 ,  G01J5/0014 ,  G01J5/0088 ,  G01J2005/0077 ,  G01N25/72 ,  Y02T50/676

Abstract: A method of thermal inspection of a component (100) defining at least one internal passageway (110, 120). The method includes receiving a continuous sequence of thermal images (712) of at least an exit hole (122) defined by the at least one internal passageway at a surface (102) of the component. The method also includes delivering a pressurized airflow pulse into the at least one internal passageway, receiving a temperature response signal (1000, 1000a, 1000b, 1000c) as function of time based on the received thermal images, determining a first derivative (1001, 1001a, 1001b, 1005) of the temperature response signal, and determining a level of blockage of the at least one internal passageway based on the first derivative of the temperature response signal.

Abstract translation: 一种限定至少一个内部通道（110,120）的部件（100）的热检查方法。 该方法包括在部件的表面（102）处接收由至少一个内部通道限定的至少一个出口孔（122）的连续的热图像序列（712）。 该方法还包括将加压气流脉冲输送到至少一个内部通道中，基于所接收的热图像接收作为时间的函数的温度响应信号（1000,1000a，1000b，1000c），确定一阶导数（1001,1001a ，1001b，1005），并且基于温度响应信号的一阶导数来确定至少一个内部通道的阻塞水平。

公开(公告)号：WO2006023212A2

公开(公告)日：2006-03-02

申请号：PCT/US2005026326

申请日：2005-07-26

Applicant: THERMAL WAVE IMAGING ,  SHEPARD STEVEN M ,  LHOTA JAMES R

Inventor： SHEPARD STEVEN M ,  LHOTA JAMES R

IPC: G03B15/03 ,  G03B41/00

CPC classification number: G03B41/00 ,  G01J2005/0081 ,  G01N25/72 ,  H04N5/33

Abstract: A method for measuring the timing of a flash event including capturing a first image prior to the commencement of a flash event. Capturing a second image during the occurrence of the flash event, and comparing the second image to the first image to determine a time related characteristic of the flash event.

Abstract translation: 一种用于测量闪光事件的定时的方法，包括在闪光灯事件开始之前拍摄第一图像。 在闪光事件发生期间捕获第二图像，以及将第二图像与第一图像进行比较，以确定闪光事件的时间相关特性。

公开(公告)号：WO0141421A2

公开(公告)日：2001-06-07

申请号：PCT/US0032799

申请日：2000-12-04

Applicant: THERMAL WAVE IMAGING INC ,  SHEPARD STEVEN M ,  RUBADEAUX BRUCE A ,  LHOTA JAMES R

Inventor： SHEPARD STEVEN M ,  RUBADEAUX BRUCE A ,  LHOTA JAMES R

IPC: H04N7/18 ,  G01N25/72 ,  H04N

CPC classification number: G01N25/72

Abstract: A method and system for non-destructive, reference free thermographic detection of sub-surface defects uses an infrared camera to capture images of a sample (204) that has been heated and allow to cool to equilibrium temperature. The temperature-time data obtained for each pixel in each image is converted into the logarithmic domain and at least squares fit is conducted on the data to generate a polynomial expression corresponding to the temperature-time data for a given pixel (212). This polynomial expression can be transformed into the original time domain to obtain temperature time data with improved signal-to-noise characteristics. Defects can be detected by observing the zero-crossing characteristic of the second derivative of the polynomial (214).

Abstract translation: 用于非表面缺陷的非破坏性，无基准热敏成像检测的方法和系统使用红外相机来捕获已被加热并允许冷却到平衡温度的样本（204）的图像。 为每个图像中的每个像素获得的温度 - 时间数据被转换成对数域，并且对数据进行至少二次拟合以产生与给定像素的温度 - 时间数据相对应的多项式表达式（212）。 这个多项式表达式可以被转换到原始时域，以获得具有改善的信噪特性的温度时间数据。 通过观察多项式（214）的二阶导数的零交叉特性可以检测缺陷。