METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY
    1.
    发明申请
    METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY 审中-公开
    扫描探针显微镜误差校正方法

    公开(公告)号:WO2018031174A3

    公开(公告)日:2018-02-15

    申请号:PCT/US2017/041740

    申请日:2017-07-12

    Abstract: Disclosed here is a scanning probe microscope system and method for operating the same for producing scanning probe microscope images at fast scan rates and reducing oscillation artifacts. In some embodiments, an inverse consistent image registration method is used to align forward and backward scan traces for each line of the scanning microscope image. In some embodiments, the aligned forward and backward scan traces are combined using a weighting factor favoring the scan trace with higher smoothness. In some embodiments, the scanning probe microscope image is a potentiometry map and a method is provided to extract from the potentiometry map a conductivity map.

    Abstract translation: 这里公开了一种扫描探针显微镜系统及其操作方法,用于以快速扫描速率产生扫描探针显微镜图像并减少振荡伪像。 在一些实施例中,使用反向一致的图像配准方法来对准扫描显微镜图像的每一行的前向和后向扫描迹线。 在一些实施例中,使用有利于具有较高平滑度的扫描轨迹的加权因子来组合对齐的前向和后向扫描轨迹。 在一些实施例中,扫描探针显微镜图像是电位测绘图,并且提供了从电位测绘图中提取电导图的方法。

    METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY

    公开(公告)号:WO2018031174A2

    公开(公告)日:2018-02-15

    申请号:PCT/US2017/041740

    申请日:2017-07-12

    Abstract: Disclosed here is a scanning probe microscope system and method for operating the same for producing scanning probe microscope images at fast scan rates and reducing oscillation artifacts. In some embodiments, an inverse consistent image registration method is used to align forward and backward scan traces for each line of the scanning microscope image. In some embodiments, the aligned forward and backward scan traces are combined using a weighting factor favoring the scan trace with higher smoothness. In some embodiments, the scanning probe microscope image is a potentiometry map and a method is provided to extract from the potentiometry map a conductivity map.

    COMMON-MASK GUIDED IMAGE RECONSTRUCTION FOR ENHANCED FOUR-DIMENSIONAL COME-BEAM COMPUTED TOMOGRAPHY
    3.
    发明申请
    COMMON-MASK GUIDED IMAGE RECONSTRUCTION FOR ENHANCED FOUR-DIMENSIONAL COME-BEAM COMPUTED TOMOGRAPHY 审中-公开
    用于增强四维COME-BEAM计算机图像的通用图像引导图像重建

    公开(公告)号:WO2016134127A1

    公开(公告)日:2016-08-25

    申请号:PCT/US2016/018437

    申请日:2016-02-18

    Abstract: A system for constructing images representing a 4DCT sequence of an object from a plurality of projections taken from a plurality of angles with respect to the object and at a plurality of times, first portions of the object being less static than second portions of the object. The system may comprise a processor configured to: iteratively process projections of the plurality of projections for a plurality of groups, each group comprising projections collected while the first portions of the object are in corresponding locations, with each iteration comprising: reconstructing first image portions representing the first portions of the object, the reconstructing of each first image portion of the first image portions being based on projections in a respective group of the plurality of groups; and reconstructing a second image portion, the second image portion representing the second portions of the object, based on projections in multiple groups of the plurality of groups and on the reconstructed first image portions.

    Abstract translation: 一种系统,用于从多个角度构造对象物体的4DCT序列的图像,该多个突起从多个角度相对于物体多次,该物体的第一部分比物体的第二部分静止。 该系统可以包括处理器,其被配置为:迭代地处理多个组的多个投影的投影,每个组包括在对象的第一部分处于相应位置时收集的投影,每个迭代包括:重建表示 物体的第一部分,基于多个组的相应组中的投影来重建第一图像部分的每个第一图像部分; 以及基于所述多个组的多组中的投影和所述重建的第一图像部分来重构第二图像部分,所述第二图像部分表示所述对象的第二部分。

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