Abstract:
A method for measuring parameters of an analog signal to determine times at which the analog signal (S) crosses predetermined voltage thresholds (V A , V B , V C , V D ), the method comprising the steps of: splitting the analog signal (S) into a number of interim signals (S A , S B , S C , S D ), the number of the interim signals corresponding to the number of the preset voltage thresholds (V A , V B , V C , V D ); providing an FPGA system (10) comprising differential buffers (11 A, 11 B, 11 C, 11 D) with outputs connected to a number of sequences (20A, 20B, 20C, 20D) of delay elements (21, 22, 23), the number of sequences of delay elements corresponding to the number of the preset voltage thresholds (V A , V B , V C , V D ); inputting, to an input of each differential buffer (11 A, 11 B, 11 C, 11 D), one interim signal (S A , S B , S C , S D ) and a reference voltage corresponding to a particular preset voltage threshold (V A , V B , V C , V D ); reading, by means of vector generators (31 A, 31 B, 31 C, 31 D), assigned separately to each of the sequences (20A, 20B, 20C, 20D) and connected to a common clock signal (CLK), current values of output signals of each of the delay elements (21, 22, 23) in the particular sequence (20A, 20B, 20C, 20D) at the same moment for all vector generators and providing these values as sequence output vectors (W A , W B , W C , W D ); and determining times at which the analog signal (S) crosses the predetermined voltage thresholds (V A , V B , V C , V D ) on the basis of the values of the sequence output vectors (W A , W B , W C , W D ) and the delays introduced by the delay elements (21, 22, 23).
Abstract:
A system for acquisition of tomographic measurement data from measurement signals (S) of positron emission tomography (PET) or single-photon emission computed tomography (SPECT) detectors, the system comprising: a front-end electronic assembly (2) configured to convert the measurement signals (S) into digital and analog signals (DAS); a measurement electronics assembly (3) comprising time to digital converter (TDC) modules (31) configured to determine times (T) of pulses in digital signals (DS). The measurement electronics assembly (30) comprises: a series (TDCa-TDCd) of TDC modules (31), each module comprising a series (TDC1-TDC4) of TDC circuits (311 -314); a module controller (315) configured to transmit a clock signal (CLK), input to the module controller (315) from a system controller (40), to each of the TDC circuits (311-314); wherein each of the TDC circuits (311-314) is configured to execute measurements in a measurement window delimited by the neighboring edges of the clock signal (CLK) which is common for all TDC circuits (311-314).