TEMPERATURE SENSING SYSTEM FOR ROTATABLE WAFER SUPPORT ASSEMBLY
    1.
    发明申请
    TEMPERATURE SENSING SYSTEM FOR ROTATABLE WAFER SUPPORT ASSEMBLY 审中-公开
    可旋转晶圆支撑组件的温度传感系统

    公开(公告)号:WO2017139353A1

    公开(公告)日:2017-08-17

    申请号:PCT/US2017/016975

    申请日:2017-02-08

    IPC分类号: G01K1/02

    摘要: A semiconductor processing apparatus includes a wafer support assembly, a temperature sensor integrated in the wafer support assembly for measuring a temperature of the wafer support assembly, and a signal transmission device that wirelessly transmits a signal relating to a temperature measurement obtained by the temperature sensor to an external control module.

    摘要翻译: 半导体处理设备包括晶片支撑组件,集成在晶片支撑组件中的温度传感器,用于测量晶片支撑组件的温度,以及信号传输设备,无线地传输关于 通过温度传感器获得温度测量值到外部控制模块。