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公开(公告)号:WO2017139353A1
公开(公告)日:2017-08-17
申请号:PCT/US2017/016975
申请日:2017-02-08
IPC分类号: G01K1/02
CPC分类号: H01L21/67248 , G01K1/024 , H01L21/67103 , H01L21/68792
摘要: A semiconductor processing apparatus includes a wafer support assembly, a temperature sensor integrated in the wafer support assembly for measuring a temperature of the wafer support assembly, and a signal transmission device that wirelessly transmits a signal relating to a temperature measurement obtained by the temperature sensor to an external control module.
摘要翻译: 半导体处理设备包括晶片支撑组件,集成在晶片支撑组件中的温度传感器,用于测量晶片支撑组件的温度,以及信号传输设备,无线地传输关于 通过温度传感器获得温度测量值到外部控制模块。 p>