Abstract:
A uniform electric component realizing a resistive-capacitive impedance, or a stub, comprising such a parallel connection of shorted and open structures of various lengths and widths of distributed RC-structures, where different structures are manifested as a steplike or smoothened shape of the line opposite the driving point of the component. The structures are also manifested as a mutual electric connection or disconnection between the resistor layer (13) and the ground plane (221) at various points of the said line. The measures of the stub are defined in a successive iteration process between the employed frequencies (f u, f u...) and the required admittances (Y u, Y u...). The stub is trimmed by shortening it or by removing or disconnecting one or more layers so that the endline of the remaining structure becomes perpendicular to the conduction band (211). The stub can also be manufactured as a reversibly trimmable structure. The stub can be used as part of a bandrejection filter.
Abstract:
Composite RC devices provide predetermined impedance properties in a package similar to multilayer ceramic capacitors of the prior art. The RC devices (10) include a plurality of first and second ceramic layers (32) interleaved to form a stack. The ceramic layers each include a suitable electrode structure (28, 30) of opposite polarity forming the equivalent of multiple two-plate capacitors. One or more resistors (34, 36) are embedded in the device body and are selectively connected to the capacitor structure. In some presently preferred embodiments, multiple parallel resistors (34, 36) are provided, such as on each electrical side of the capacitor structure.
Abstract:
A two-step tuning process for resistors (410) and capacitors (420) in an integrated circuit (170) is described. In the first step of the tuning process, an on-chi? adjustable resistor (410) is tuned based on an external resistor to obtain a tuned resistor. The value of the tuned resistor is accurate within a target percentage determined by the external resistor and the design of the adjustable resistor (410). In the second step, an adjustable capacitor (420) is tuned based on the value of the tuned resistor and an accurate clock to obtain a tuned capacitor having an accurate value. The adjustable capacitor (420) may be tuned such that an RC time constant for the tuned resistor and the tune capacitor is accurate within a target percentage determined by the accurate clock and the design of the adjustable capacitor (420). The resistors and capacitors of other circuits on the integrated circuit may be adjusted based on the tuned resistor and the tuned capacitor, respectively.
Abstract:
A two-step tuning process for resistors and capacitors in an integrated circuit is described. In the first step of the tuning process, an on-chip adjustable resistor is tuned based on an external resistor to obtain a tuned resistor. The value of the tuned resistor is accurate to within a target percentage determined by the external resistor and the design of the adjustable resistor. In the second step, an adjustable capacitor is tuned based on the tuned resistor and an accurate clock to obtain a tuned capacitor having an accurate value. The adjustable capacitor may be tuned such that an RC time constant for the tuned resistor and the tune capacitor is accurate to within a target percentage determined by the accurate clock and the design of the adjustable capacitor. The resistors and capacitors of other circuits on the integrated circuit may be adjusted based on the tuned resistor and the tuned capacitor, respectively.
Abstract:
Methods and apparatus are provided for tuning out time constant deviations of a network (414) due to process, voltage, and temperature variations. The apparatus (400) 5 comprises a clock reference (404) from which a digital time constant is correlated to the nominal time constant of the network (414). The correlated digital time constant is applied to the network (414), and the output charge/discharge waveform swing is compared to a predetermined reference voltage. If the charge/discharge waveform swing does not match the reference voltage, an offset signal is generated. The offset signal is applied to a control circuit (402) that generates a corresponding tuning signal. The tuning signal is applied to the network (414) to adjust the internal components incrementally until a match is achieved. The apparatus (400) can be configured as a built-in self -test digital time constant tracking circuit, and can be integrated with the network (414) on an IC chip.
Abstract:
The inventive supply-line filter relates to electrical engineering, in particular to filters for suppressing and eliminating high-frequency electromagnetic componenets in a power alternating-current circuit. Said invention makes it possible to essentially reduce the amplitude of a high-frequency electromagnetic voltage component within a frequency range of 1-100 kHz, and to simplify the filter design and reduce the size thereof. Said technical result is achieved by said supply-line filter which comprises a capacitor and a resistor which are embodied in the form of a non-inductive thin-film capacitor and a resistor in parallel connected thereto. A capacitor whose capacity ranges from 5 to 30 mu F and a resistor whose resistance ranges from 20 to 100 k OMEGA are used.
Abstract:
A PLL circuit comprising a loop filter with at least a first and a second bandwith is provided. The first bandwith of the loop filter is determined by a first network of circuit components and used out of the linear rangs of the PLL circuit and the second bandwith is determined by a second network of circuit components and used within the linear range of the PLL circuit. A node of said second network is charged to a voltage level given by a node of said first network while the second network is switched off. When the second network is switched in, no long lasting charging process is required. Therefore, the lock time of the PLL circuit is reduced.
Abstract:
A low-pass filtering cell uses a resistive line with distributed capacity (LR) having an intermediary plug (P) to which there is connected a looping capacitor (C1), the resistive line being connected to the input of an operational amplifier (A). The intermediary plug is located at one third of the length of the line in order to minimize the global size of the cell while obtaining a response curve which is as flat as possible.
Abstract:
Certain aspects of the present disclosure generally relate to generating a large electrical resistance. One example circuit generally includes a first transistor 210, 220 having a gate, a source connected with a first node 214 of the circuit, and a drain connected with a second node 216 of the circuit. The circuit may also include a voltage-limiting device 224, 226 connected between the gate and the source of the first transistor, wherein the device, if forward biased, is configured to limit a gate-to-source voltage of the first transistor such that the first transistor operates in a sub-threshold region. The circuit may further include a second transistor 212, 222 configured to bias the voltage-limiting device with a current, wherein a drain of the second transistor is connected with the gate of the first transistor, a gate of the second transistor is connected with the first node, and a source of the second transistor is connected with an electric potential.