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公开(公告)号：WO2021197449A1
公开(公告)日：2021-10-07
申请号：PCT/CN2021/085083
申请日：2021-04-01
申请人： 西安交通大学
IPC分类号： G01R31/12 , G01R31/20 , G01R1/02 , G01R1/0425 , G01R31/1218 , G01R31/1263
摘要： 一种电缆附件用硅橡胶材料的电树枝试验装置及试样制作方法，将半导电硅橡胶加入到二甲苯中，然后在硅橡胶绝缘样片表面喷洒，固化，然后裁剪为纵截面端部呈三角形的高压电极，然后将高压电极粘贴在硅橡胶绝缘样片表面，高温硫化，得到压电极硅橡胶样片；将压电极硅橡胶样片放入模具中，注胶，高温硫化，得到试样；然后在距离高压电极尖端2mm处裁剪，在截面处粘贴平板结构地电极即可。采用该试样在大机械形变下高压电极尖端不会出现气隙与裂纹。而且，实际电缆附件中电树枝通常由半导电向绝缘部分发展，半导电材料作为高压电极与电缆附件实际工作工况更加相似。
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公开(公告)号：WO2019241280A1
公开(公告)日：2019-12-19
申请号：PCT/US2019/036596
申请日：2019-06-11
申请人： TEKTRONIX, INC.
摘要： A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.
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公开(公告)号：WO2019234412A3
公开(公告)日：2019-12-12
申请号：PCT/GB2019/051545
申请日：2019-06-04
摘要： The present invention relates to a handheld device (10) for detecting a partial discharge event, the device comprising: • a first probe (12) having a first partial discharge sensor (14) disposed within; and • a second probe (20) having a second partial discharge sensor (26) disposed within, the second probe being electrically connected to the first probe by a connecting cable (24); • wherein the first and second probes comprise means for measuring a difference in time of arrival of a detected partial discharge event.
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公开(公告)号：WO2018186802A1
公开(公告)日：2018-10-11
申请号：PCT/SG2018/050143
申请日：2018-03-28
摘要： A vertical type test assembly with adjustable contact pressure feature for test on wafer. The test assembly having a probe head comprising a plurality of guide plates with a plurality of through holes wherein at least one the plurality of guide plates can be moved in a Z-direction. The test assembly further comprising a plurality of probe needles extending from a substrate end of the test assembly towards a distal end contacting contact pads on a wafer in operation. The guide plate moveable in the Z-direction is moved closer or away from at least one other of the plurality of guide plates in the test assembly thereby adjusting the force with which the probe needles contact the contact pads on the wafer and the substrate. This allows for easy correction of the contact force of the contact element with the wafer's test pad.
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公开(公告)号：WO2017092165A1
公开(公告)日：2017-06-08
申请号：PCT/CN2016/071788
申请日：2016-01-22
申请人： 深圳华盛昌机械实业有限公司
发明人： 袁剑敏
摘要： 一种背光仪表，包括外壳（10）、旋钮（21）、档位刻度盘（40）、主板（50）、固定于外壳（10）上的透光环（41）、光源组件（44）、设于光源组件（44）与透光环（41）之间的导光板（45）、导光柱（22）和背光盘（30），背光盘（30）包括转盘（31）和安装于转盘（31）上的LED灯（32），旋钮（21）中开设有连接通孔（211），导光柱（22）安装于连接通孔（211）中，档位刻度盘（40）设置于透光环（41）的外表面。使得在黑暗环境下仍可以正常使用仪器仪表。
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公开(公告)号：WO2017057786A1
公开(公告)日：2017-04-06
申请号：PCT/KR2015/010361
申请日：2015-10-01
申请人： 주식회사 아이에스시
发明人： 정영배
摘要： 본 발명은 검사용 커넥터에 대한 것으로서, 더욱 상세하게는 피검사 디바이스와 검사장치의 사이에 배치되어 피검사 디바이스의 단자와 검사장치의 패드를 서로 전기적으로 접속시키기 위한 검사용 커넥터에 있어서, 상기 피검사 디바이스의 단자와 대응되는 위치마다 절연성 탄성물질 내에 다수의 도전성 입자가 두께방향으로 배열되어 있는 도전부와, 각각의 도전부 사이에 배치되어 도전부를 감싸면서 도전부를 지지하는 절연지지부와, 각각의 도전부의 내부에 배치되며 도전성 와이어가 나선방향으로 감겨있는 탄성체를 포함하되, 상기 탄성체는 복수개가 도전부 내에 서로 인접하게 배치되어 있는 검사용 커넥터에 대한 것이다.
摘要翻译： 测试连接器技术领域本发明涉及一种测试连接器，更具体地，涉及一种测试连接器，该测试连接器设置在待测试设备和测试设备之间，并且用于将待测试设备的终端与测试设备的焊盘电连接 。 测试连接器包括：具有多个导电颗粒的导电部件，其厚度方向在绝缘弹性材料的内部和对应于待测试装置的端子的位置上; 布置在导电部分之间的绝缘支撑部分覆盖导电部分并支撑导电部分; 以及弹性体，其设置在每个导电部分内并且具有螺旋缠绕的导线，其中所述多个弹性体在所述导电部分内部彼此相邻。
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7.发明申请
公开(公告)号：WO2015135170A1
公开(公告)日：2015-09-17
申请号：PCT/CN2014/073347
申请日：2014-03-13
申请人： MICRO MOTION, INC. , WANG, Lingjun
发明人： WANG, Lingjun
CPC分类号： G06F13/4068 , G06F13/385 , H01R29/00
摘要： A method (700) for reconfiguring pin assignments on a connector (100) is provided. The method (700) includes reading a present accessory type (34a) from an accessory (30) coupled to the connector (100) having a plurality of pins (110) wherein the present accessory type (34a) is associated with an accessory pin assignment (31) of the connector (100), and comparing the present accessory type (34a) to a stored accessory type (18a) associated with a connector pin assignment (17) to determine if the accessory pin assignment (31) is compatible with the connector pin assignment (17).
摘要翻译： 提供了一种用于在连接器（100）上重新配置引脚分配的方法（700）。 方法（700）包括从联接到具有多个销（110）的连接器（100）的附件（30）读取当前附件类型（34a），其中当前附件类型（34a）与附件引脚分配相关联 （100）的连接器（31），并且将当前附件类型（34a）与与连接器引脚分配（17）相关联的存储的附件类型（18a）进行比较，以确定附件引脚分配（31）是否与 连接器引脚分配（17）。
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公开(公告)号：WO2014205935A1
公开(公告)日：2014-12-31
申请号：PCT/CN2013/084152
申请日：2013-09-25
申请人： 中国科学院深圳先进技术研究院
CPC分类号： G01R1/07378
摘要： 提供一种测试基板及采用该测试基板制造的探针卡，所述测试基板顶部表面上的测试端微凸起（2）按照待测晶片（10）底部待测触点（7）的布局进行排列，通过顶层布线（8）与过基板穿孔（3）对应连接并电导通，过基板穿孔（3）与测试基板底部表面的探测凸起（4）对应连接并电导通，探测凸起（4）与测试探针（13）的尺寸相匹配，建立了测试探针（13）与测试端微凸起（2）和待测触点（7）间一一对应的信号关系，解决了现有技术中因测试探针（13）尺寸过大而待测触点（7）尺寸过小，无法通过测试探针（13）直接对每一待测触点（7）进行检测的问题。通过在测试基板顶部表面铺上异方性导电胶，使得测试端微凸起（2）与待测触点（7）无需接触即可电导通，避免了对晶片（10）的损伤且提高了信号传输性质。
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公开(公告)号：WO2008093852A3
公开(公告)日：2008-10-23
申请号：PCT/JP2008051693
申请日：2008-01-28
申请人： CANON KK , KATO KAZUHIKO , OGAWA TOSHIYUKI , ZAITSU YOSHITAKA , USHIJIMA TAKASHI , NOGUCHI KAORU , KANDORI ATSUSHI , HIROSE FUTOSHI
发明人： KATO KAZUHIKO , OGAWA TOSHIYUKI , ZAITSU YOSHITAKA , USHIJIMA TAKASHI , NOGUCHI KAORU , KANDORI ATSUSHI , HIROSE FUTOSHI
IPC分类号： G01R1/02
CPC分类号： G03G15/0266 , G01R29/12 , G03G15/5037
摘要： A potential measurement apparatus for measuring a surface potential (V) of an object of measurement (2) detects a change in electric charge induced at a detection electrode (1) due to electrostatic induction by changing a distance (dt ?) between the detection electrode and the object of measurement in accordance with a predetermined period (?) using a neutral distance (d) as reference, as a signal representing a change in electric current. The potential measurement apparatus includes a first detection unit for detecting a signal (V1) representing a fundamental period of the change in electric current and a signal (V2) representing a second harmonic period, a second detection unit for detecting information (Vr) representing a capacitance between the detection electrode at the neutral distance and the object of measurement and an arithmetic unit (3) for computationally obtaining information on the surface potential of the object of measurement, with eliminating an influence of 20 the neutral distance and the capacitance, according to an outcome of detection of the first detection unit and an outcome of detection of the second detection unit.
摘要翻译： 用于测量测量对象（2）的表面电位（V）的电位测量装置通过改变检测电极（2）之间的距离（dtθ）来检测由于静电感应而在检测电极（1）处感应的电荷的变化 以及使用中性距离（d）作为参考的根据预定周期（α）的测量对象作为表示电流变化的信号。 电位测量装置包括用于检测表示电流变化的基本周期的信号（V1）的第一检测单元和表示二次谐波周期的信号（V2），用于检测表示第二谐波周期的信息（Vr）的第二检测单元 中性距离的检测电极与测量对象之间的电容和用于计算获得关于测量对象的表面电位的信息的算术单元（3），根据中性距离和电容的消除20的影响 检测第一检测单元的结果和第二检测单元的检测结果。
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公开(公告)号：WO2008093852A2
公开(公告)日：2008-08-07
申请号：PCT/JP2008/051693
申请日：2008-01-28
申请人： CANON KABUSHIKI KAISHA , KATO, Kazuhiko , OGAWA, Toshiyuki , ZAITSU, Yoshitaka , USHIJIMA, Takashi , NOGUCHI, Kaoru , KANDORI, Atsushi , HIROSE, Futoshi
发明人： KATO, Kazuhiko , OGAWA, Toshiyuki , ZAITSU, Yoshitaka , USHIJIMA, Takashi , NOGUCHI, Kaoru , KANDORI, Atsushi , HIROSE, Futoshi
IPC分类号： G01R1/02
CPC分类号： G03G15/0266 , G01R29/12 , G03G15/5037
摘要： A potential measurement apparatus for measuring a surface potential of an object of measurement detects a change in electric charge induced at a detection electrode due to electrostatic induction by changing a distance between the detection electrode and the object of measurement in accordance with a predetermined period, using a neutral distance as reference, as a signal representing a change in electric current. The potential measurement apparatus includes a first detection unit for detecting a signal representing a fundamental period of the change in electric current and a signal representing a second harmonic period, a second detection unit for detecting information representing a capacitance between the detection electrode at the neutral distance and the object of measurement and an arithmetic unit for computationally obtaining information on the surface potential of the object of measurement, with eliminating an influence of the neutral distance and the capacitance, according to an outcome of detection of the first detection unit and an outcome of detection of the second detection unit.
摘要翻译： 用于测量测量对象的表面电位的电位测量装置根据预定周期改变检测电极与测量对象之间的距离，通过使用静电感应来检测在检测电极处感应的电荷的变化，使用 作为参考的中性距离，作为表示电流变化的信号。 电位测量装置包括：第一检测单元，用于检测表示电流变化的基本周期的信号和表示二次谐波周期的信号;第二检测单元，用于检测表示中性距离处的检测电极之间的电容的信息 以及测量对象和运算单元，用于根据第一检测单元的检测结果和消除第一检测单元的检测结果消除中性距离和电容的影响来计算获得关于测量对象的表面电位的信息， 检测第二检测单元。
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