The invention relates to a multi-unit test probe card with illuminance regulation mechanism and an illuminance regulation method. The probe card is used for simultaneously testing multiple photoelectric elements, and comprises a circuit board, a plurality of shielding sheets and a plurality of probes. The circuit board is provided with a plurality of light transmission holes for test light to go through; the position of each light transmission hole correspond to each photoelectric elements; each light shielding sheet is arranged on an optical path where the test light passes through each of the light transmission hole; the light shielding sheet has a substrate and a pattern formed on the substrate; the light transmittance rate of the substrate is higher than that of the pattern, and the light transmittance rates of at least two light shielding sheets are different; each probe is electrically connected to the circuit board for point contact with the photoelectric elements. As a result, the probe card of the invention can use a low cost and an easy accessible way to regulate illuminance degree of the tested object.