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发明公开
CN107699869A 通过在整个沉积过程中改变晶片温度来抑制界面反应 有权

通过在整个沉积过程中改变晶片温度来抑制界面反应
摘要：
本发明涉及通过在整个沉积过程中改变晶片温度来抑制界面反应。公开了用于在多站沉积装置中沉积膜的方法和装置以及系统。所述方法可以包括：(a)向所述装置的第一站提供衬底，(b)将所述衬底的温度调节至第一温度，(c)当所述衬底在所述第一站中处于所述第一温度下时，将材料的第一部分沉积在所述衬底上，(d)将所述衬底传送到第二站，(e)将所述衬底的温度调节至第二温度，和(f)当所述衬底处于所述第二温度下时，将所述材料的第二部分沉积在所述衬底上，使得所述第一部分和所述第二部分表现出不同的材料属性值。所述装置和系统可以包括多站沉积装置以及具有用于执行(a)-(f)中的一个或多个的控制逻辑的控制器。
摘要（英）：

Suppressing interfacial reactions by varying the wafer temperature throughout deposition. Disclosed are methods of and apparatuses and systems for depositing a film in a multi-station deposition apparatus. The methods may include: (a) providing a substrate to a first station of the apparatus, (b) adjusting the temperature of the substrate to a first temperature, (c) depositing a first portion of the material on the substrate while the substrate is at the first temperature in the first station, (d) transferring the substrate to the second station, (e) adjusting the temperature of the substrateto a second temperature, and (f) depositing a second portion of the material on the substrate while the substrate is at the second temperature, such that the first portion and the second portion exhibit different values of a property of the material. The apparatuses and systems may include a multi-station deposition apparatus and a controller having control logic for performing one or more of (a)-(f).

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