The invention discloses a quality analysis method and a mass spectrometer suitable for a high pressure intensity environment, and belongs to the technical field of the mass spectrometer analysis. Themass spectrometer is provided for solving an existing problem in a current mass spectrometer that ions are remained in a center area of a quality analyzer under the high pressure intensity in short ofmovement power, and the quality analysis cannot be performed. The method comprises the following steps: ionizing a sample in an ion source, enabling generated ions to enter the quality analyzer, enabling the ions to be moved in a direction from a drift tube to an ion detector, feeding a forward airflow to the drift tube as the ion trap departure power, and enabling the ions to reach the ion detector finally under the combined action of an airflow field and a quadrupolar electric field, and generating spectrogram information.