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EP0019456A1 Semiconductor devices and method for producing the same 失效
半导体器件及其制备方法。

  • 专利标题: Semiconductor devices and method for producing the same
  • 专利标题(中): 半导体器件及其制备方法。
  • 申请号: EP80301576.7
    申请日: 1980-05-14
  • 公开(公告)号: EP0019456A1
    公开(公告)日: 1980-11-26
  • 发明人: Kawabe, YunosukeMomma, Yoshinobu
  • 申请人: FUJITSU LIMITED
  • 申请人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
  • 专利权人: FUJITSU LIMITED
  • 当前专利权人: FUJITSU LIMITED
  • 当前专利权人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
  • 代理机构: Allman, Peter John
  • 优先权: JP61229/79 19790518
  • 主分类号: H01L21/76
  • IPC分类号: H01L21/76 H01L29/72 H01L29/06
Semiconductor devices and method for producing the same
摘要:
In a semiconductor device comprising at least one bipolar transistor (45) and a VIP isolating layer (43) which are formed in both an epitaxial layer (33) and a semiconductor substrate (31), an impurity-introduced region (37) having the same conductivity type as that of the semiconductor substrate (31) is formed so asto surround the V-groove (36). A buried layer (32) of the bipolartransistor comes into contact with the VIP isolating layer (39,40) to divide the impurity-intorduced region into two parts, one of which is combined with a base region (37) and the other one of which serves as a channel stopper (38).
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