Invention Grant
- Patent Title: Verfahren zur Analyse einer Probe
- Patent Title (English): Sample analysis method
- Patent Title (中): 一种用于分析样品的方法
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Application No.: EP98108907.1Application Date: 1998-05-15
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Publication No.: EP0878827B1Publication Date: 2002-02-27
- Inventor: Maul, Johann L. Dr. , Dowsett, Mark G.
- Applicant: Atomika Instruments GmbH
- Applicant Address: Bruckmannring 40 85764 Oberschleissheim DE
- Assignee: Atomika Instruments GmbH
- Current Assignee: Atomika Instruments GmbH
- Current Assignee Address: Bruckmannring 40 85764 Oberschleissheim DE
- Agency: Graf Lambsdorff, Matthias, Dr.
- Priority: DE19720458 19970515
- Main IPC: H01J49/14
- IPC: H01J49/14 ; G01N23/225 ; H01J37/256 ; H01J37/252
Public/Granted literature
- EP0878827A1 Verfahren zur Analyse einer Probe Public/Granted day:1998-11-18
Information query
