发明公开
EP1248865A1 ATOMIC-LAYER-CHEMICAL-VAPOR-DEPOSITION OF FILMS THAT CONTAIN SILICON DIOXIDE
有权
ATOMSCHICHTEN-CVD VON SLIZIUMDIOXID-ENTHALTENDENFILMEN
- 专利标题: ATOMIC-LAYER-CHEMICAL-VAPOR-DEPOSITION OF FILMS THAT CONTAIN SILICON DIOXIDE
- 专利标题(中): ATOMSCHICHTEN-CVD VON SLIZIUMDIOXID-ENTHALTENDENFILMEN
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申请号: EP00987492.6申请日: 2000-12-04
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公开(公告)号: EP1248865A1公开(公告)日: 2002-10-16
- 发明人: ARO, Eva , HAUKKA, Suvi , TUOMINEN, Marko
- 申请人: ASM Microchemistry Oy
- 申请人地址: Kutojantie 2 B 02630 Espoo FI
- 专利权人: ASM Microchemistry Oy
- 当前专利权人: ASM Microchemistry Oy
- 当前专利权人地址: Kutojantie 2 B 02630 Espoo FI
- 代理机构: Sundman, Christoffer
- 优先权: FI992616 19991203
- 国际公布: WO01040541 20010607
- 主分类号: C23C16/40
- IPC分类号: C23C16/40 ; C23C16/44 ; C23C16/00 ; C30B25/02
摘要:
Process for producing silicon oxide containing thin films on a growth substrate by the ALCVD method. In the process, a vaporizable silicon compound is bonded to the growth substrate, and the bonded silicon compound is converted to silicon dioxide. The invention comprises using a silicon compound which contains at least one organic ligand and the bonded silicon compound is converted to silicon dioxide by contacting it with a vaporized, reactive oxygen source, in particular with ozone. The present invention provides a controlled process for growing controlling thin films containing SiO2, with sufficiently short reaction times.
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