发明公开
EP1248865A1 ATOMIC-LAYER-CHEMICAL-VAPOR-DEPOSITION OF FILMS THAT CONTAIN SILICON DIOXIDE 有权
ATOMSCHICHTEN-CVD VON SLIZIUMDIOXID-ENTHALTENDENFILMEN

ATOMIC-LAYER-CHEMICAL-VAPOR-DEPOSITION OF FILMS THAT CONTAIN SILICON DIOXIDE
摘要:
Process for producing silicon oxide containing thin films on a growth substrate by the ALCVD method. In the process, a vaporizable silicon compound is bonded to the growth substrate, and the bonded silicon compound is converted to silicon dioxide. The invention comprises using a silicon compound which contains at least one organic ligand and the bonded silicon compound is converted to silicon dioxide by contacting it with a vaporized, reactive oxygen source, in particular with ozone. The present invention provides a controlled process for growing controlling thin films containing SiO2, with sufficiently short reaction times.
信息查询
0/0