发明公开
- 专利标题: SEMICONDUCTOR RADIATION DETECTING ELEMENT
- 专利标题(中): 半导体辐射检测元件
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申请号: EP02718533申请日: 2002-04-11
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公开(公告)号: EP1391940A4公开(公告)日: 2006-08-09
- 发明人: MORIYAMA MIKI , MURAKAMI MASAKI , KYAN ATSUSHI , OHNO RYOICHI
- 申请人: ACRORAD CO LTD
- 专利权人: ACRORAD CO LTD
- 当前专利权人: ACRORAD CO LTD
- 优先权: JP2001144313 2001-05-15
- 主分类号: G01T1/24
- IPC分类号: G01T1/24 ; H01L27/14 ; H01L31/0224 ; H01L31/0296 ; H01L31/032 ; H01L31/09 ; H01L31/108 ; H01L31/118
摘要:
A Schottky barrier type radiation detecting element having a compound InxCdyTez comprising indium and cadmium, as means for applying a voltage to a compound semiconductor crystal principally comprising cadmium and tellurium, on one side of the compound semiconductor crystal. Percentage z of tellurium content in the compound InxCdyTez is preferably in the range of 42.9%-50% expressed in terms of the ratio of the number of atoms and percentage y of cadmium content in the compound InxCdyTez is preferably in the range of 0%-10% expressed in terms of the ratio of the number of atoms.
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