发明公开
- 专利标题: MAGNETORESISTANCE EFFECT ELEMENT AND MAGNETIC MEMORY UNIT
- 专利标题(中): 元磁阻效应和磁存储单元
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申请号: EP03766709.4申请日: 2003-08-01
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公开(公告)号: EP1526588A1公开(公告)日: 2005-04-27
- 发明人: OBA, Kazuhiro, c/o Sony Corporation , KANO, Hiroshi, c/o Sony Corporation , HOSOMI, Masanori, c/o Sony Corporation , BESSHO, Kazuhiro, c/o Sony Corporation , YAMAMOTO, Tetsuya, c/o Sony Corporation , MIZUGUCHI, Tetsuya, c/o Sony Corporation
- 申请人: Sony Corporation
- 申请人地址: 7-35, Kitashinagawa 6-chome, Shinagawa-ku Tokyo 141-0001 JP
- 专利权人: Sony Corporation
- 当前专利权人: Sony Corporation
- 当前专利权人地址: 7-35, Kitashinagawa 6-chome, Shinagawa-ku Tokyo 141-0001 JP
- 代理机构: Müller - Hoffmann & Partner
- 优先权: JP2002226520 20020802
- 国际公布: WO2004013919 20040212
- 主分类号: H01L43/08
- IPC分类号: H01L43/08 ; H01L27/105 ; G11B5/39 ; G01R33/09 ; H01F10/13 ; H01F10/32
摘要:
A magnetoresistive effect element may be given satisfactory magnetic characteristics because a deterioration of a magnetoresistive changing rate by annealing can be suppressed and a magnetic memory device includes this magnetoresistive effect element to provide excellent write characteristics.
A magnetoresistive effect element has a pair of ferromagnetic layers (magnetization fixed layer 5 and magnetization free layer 7) opposed to each other through an intermediate layer 6 to cause an electric current to flow in the direction perpendicular to the layer surface to obtain a magnetoresistive change. A magnetic memory device comprises the magnetoresistive effect element 1 in which at least one of the pair of ferromagnetic layers 5, 7 contains an amorphous ferromagnetic material whose crystallization temperature is higher than 623k and bit lines and word lines sandwiching this magnetoresistive effect element and the magnetoresistive effect element in the thickness direction.
A magnetoresistive effect element has a pair of ferromagnetic layers (magnetization fixed layer 5 and magnetization free layer 7) opposed to each other through an intermediate layer 6 to cause an electric current to flow in the direction perpendicular to the layer surface to obtain a magnetoresistive change. A magnetic memory device comprises the magnetoresistive effect element 1 in which at least one of the pair of ferromagnetic layers 5, 7 contains an amorphous ferromagnetic material whose crystallization temperature is higher than 623k and bit lines and word lines sandwiching this magnetoresistive effect element and the magnetoresistive effect element in the thickness direction.
公开/授权文献
- EP1526588B1 MAGNETORESISTANCE EFFECT ELEMENT AND MAGNETIC MEMORY UNIT 公开/授权日:2012-01-04
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