发明公开
EP2214001A1 OPTICAL ELECTRIC FIELD AMPLIFYING ELEMENT AND PROBE USING THE SAME
有权
优化电子产品焊接VERSTÄRKENDESELEMENT UND SONDE UNTER VERWENDUNG DAVON
- 专利标题： OPTICAL ELECTRIC FIELD AMPLIFYING ELEMENT AND PROBE USING THE SAME
- 专利标题（中）： 优化电子产品焊接VERSTÄRKENDESELEMENT UND SONDE UNTER VERWENDUNG DAVON
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申请号： EP08841615.1申请日： 2008-10-24
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公开(公告)号： EP2214001A1公开(公告)日： 2010-08-04
- 发明人: SHINGAYA, Yoshitaka , NAKAYAMA, Tomonobu , AONO, Masakazu
- 申请人： Japan Science and Technology Agency , National Institute for Materials Science
- 申请人地址： 1-8, Honcho 4-chome Kawaguchi-shi Saitama 332-0012 JP
- 专利权人： Japan Science and Technology Agency,National Institute for Materials Science
- 当前专利权人： Japan Science and Technology Agency,National Institute for Materials Science
- 当前专利权人地址： 1-8, Honcho 4-chome Kawaguchi-shi Saitama 332-0012 JP
- 代理机构： Calamita, Roberto
- 优先权： JP2007276691 20071024
- 国际公布： WO2009054507 20090430
- 主分类号： G01N21/65
- IPC分类号： G01N21/65 ; B82B1/00
摘要：
The optical electric field enhancement element of the invention comprises a nanorod where a conductive layer and an insulating layer are laminated. In particular, the optical electric field enhancement element comprising a tungsten oxide nanorod exhibits a high enhancement effect not by an aggregate of fine crystals but by the crystal structure itself, therefore securing good reproducibility and a stable Raman scattering enhancement effect. A sensor comprising the optical electric field enhancement element enables various high-precision analyses heretofore impossible in the art.
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