发明公开
- 专利标题： METALLIC DEVICE FOR SCANNING PROBE MICROSCOPY AND METHOD FOR MANUFACTURING SAME
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申请号： EP16875011.5申请日： 2016-12-13
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公开(公告)号： EP3392663A1公开(公告)日： 2018-10-24
- 发明人: DE LOURENÇO E VASCONCELOS, Thiago , SANTOS DE OLIVEIRA, Bruno , ALBERTO ACHETE, Carlos , SOARES ARCHANJO, Bráulio , JORIO DE VASCONCELOS, Ado , DE OLIVEIRA LOPES CANÇADO, Luiz Gustavo , NUNES RODRIGUES, Wagner , ARANTES DA SILVA WETZSTEIN, Caroline , VALASKI, Rogerio , RABELO E SILVA, Cassiano
- 申请人： Universidade Federal De Minas Gerais - UFMG , Instituto Nacional de Metrologia Qualidade e Tecnologia - Inmetro
- 申请人地址： Avenida Antônio Carlos 6627 Unidade Administrativa II 2° andar Sala 2012 Pampulha 31270-901 Belo Horizonte BR
- 专利权人： Universidade Federal De Minas Gerais - UFMG,Instituto Nacional de Metrologia Qualidade e Tecnologia - Inmetro
- 当前专利权人： Universidade Federal De Minas Gerais - UFMG,Instituto Nacional de Metrologia Qualidade e Tecnologia - Inmetro
- 当前专利权人地址： Avenida Antônio Carlos 6627 Unidade Administrativa II 2° andar Sala 2012 Pampulha 31270-901 Belo Horizonte BR
- 代理机构： Carvajal y Urquijo, Isabel
- 优先权： BR102015312032 20151214; BR102015291267 20161212
- 国际公布： WO2017103789 20170622
- 主分类号： G01Q70/16
- IPC分类号： G01Q70/16 ; G01Q60/38 ; G01R1/067
摘要：
The present invention relates to a device for uses in scanning probe microscopy and to a method for manufacturing same. The metallic device comprises a single body (1) with two parts (2) and (3), wherein the second part (3) has a submicrometric point (4) that defines a nanoscale apex (7). The present invention also provides a method for manufacturing a high optical efficiency probe for scanning probe microscopy.
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