公开(公告)号：EP3293526A1

公开(公告)日：2018-03-14

申请号：EP16789396.5

申请日：2016-05-06

申请人： Universidade Federal De Minas Gerais - UFMG ,  Instituto Nacional de Metrologia Qualidade e Tecnologia - Inmetro

发明人： DE LOURENÇO E VASCONCELOS, Thiago ,  SOARES ARCHANJO, Bráulio ,  DE OLIVEIRA LOPES CANÇADO, Luiz Gustavo ,  ACHETE, Carlos Alberto ,  NUNES RODRIGUES, Wagner ,  JORIO DE VASCONCELOS, Ado ,  FRAGNEAUD, Benjamin ,  DOS SANTOS RIBEIRO, Douglas ,  RABELO E SILVA, Cassiano ,  SANTOS DE OLIVEIRA, Bruno

IPC分类号： G01Q60/18 ,  G01Q70/12 ,  G01Q70/08

CPC分类号： G01Q70/10 ,  G01Q60/22

摘要： The present invention relates to a metallic device for near-field optical microscopy and spectroscopy, as well as to a method of preparing it. Said device comprises a single body (1) with longitudinal prolongation (2), nanometric apex (4) and has at least one trimming (3) on its surface, being applied as a probe of high optical efficiency, with adequate dimensions and details that enable the best photon-plasmon coupling, enabling the analysis, with high space resolution, of structures of nanometric dimensions with high efficiency and reproducibility.

摘要翻译： 本发明涉及用于近场光学显微镜和光谱学的金属装置，以及制备它的方法。 所述装置包括具有纵向延伸部（2），纳米顶点（4）并且在其表面上具有至少一个修剪部（3）的单一主体（1），其被应用为具有高光学效率的探针，具有足够的尺寸和细节 实现最佳的光子 - 等离子激元耦合，以高空间分辨率实现纳米尺寸结构的高效率和高重现性分析。

公开(公告)号：EP3392663A1

公开(公告)日：2018-10-24

申请号：EP16875011.5

申请日：2016-12-13

申请人： Universidade Federal De Minas Gerais - UFMG ,  Instituto Nacional de Metrologia Qualidade e Tecnologia - Inmetro

发明人： DE LOURENÇO E VASCONCELOS, Thiago ,  SANTOS DE OLIVEIRA, Bruno ,  ALBERTO ACHETE, Carlos ,  SOARES ARCHANJO, Bráulio ,  JORIO DE VASCONCELOS, Ado ,  DE OLIVEIRA LOPES CANÇADO, Luiz Gustavo ,  NUNES RODRIGUES, Wagner ,  ARANTES DA SILVA WETZSTEIN, Caroline ,  VALASKI, Rogerio ,  RABELO E SILVA, Cassiano

IPC分类号： G01Q70/16 ,  G01Q60/38 ,  G01R1/067

CPC分类号： G01Q60/22 ,  G01Q70/10 ,  G01R1/067

摘要： The present invention relates to a device for uses in scanning probe microscopy and to a method for manufacturing same. The metallic device comprises a single body (1) with two parts (2) and (3), wherein the second part (3) has a submicrometric point (4) that defines a nanoscale apex (7). The present invention also provides a method for manufacturing a high optical efficiency probe for scanning probe microscopy.