- 专利标题: X-RAY PHASE DIFFERENCE IMAGING APPARATUS
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申请号: EP17830889.6申请日: 2017-07-10
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公开(公告)号: EP3488783A1公开(公告)日: 2019-05-29
- 发明人: HORIBA, Akira , TANABE, Koichi , YOSHIMUTA, Toshinori , KIMURA, Kenji , KISHIHARA, Hiroyuki , WADA, Yukihisa , IZUMI, Takuro , SHIRAI, Taro , DOKI, Takahiro , SANO, Satoshi , SHIMURA, Takayoshi , WATANABE, Heiji , HOSOI, Takuji
- 申请人: Shimadzu Corporation , Osaka University
- 申请人地址: 1 Nishinokyo-Kuwabaracho Nakagyo-ku Kyoto-shi Kyoto 604-8511 JP
- 专利权人: Shimadzu Corporation,Osaka University
- 当前专利权人: Shimadzu Corporation,Osaka University
- 当前专利权人地址: 1 Nishinokyo-Kuwabaracho Nakagyo-ku Kyoto-shi Kyoto 604-8511 JP
- 代理机构: Müller-Boré & Partner Patentanwälte PartG mbB
- 优先权: JP2016142604 20160720
- 国际公布: WO2018016369 20180125
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).
公开/授权文献
- EP3488783B1 X-RAY PHASE DIFFERENCE IMAGING APPARATUS 公开/授权日:2020-11-04
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