公开(公告)号：EP3488783A1

公开(公告)日：2019-05-29

申请号：EP17830889.6

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： HORIBA, Akira ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00

摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

公开(公告)号：EP3520697A1

公开(公告)日：2019-08-07

申请号：EP17855414.3

申请日：2017-07-28

申请人： Shimadzu Corporation ,  Osaka University

发明人： SANO, Satoshi ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00 ,  G01N23/20

摘要： An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit 3b and an arrangement pitch of phase shift sections 5a related to a phase grating 5. A positional relationship among the multi-slit 3b, the phase grating 5, and an FPD 4 is determined based on the arrangement pitch of the slits related to the multi-slit 3b, the arrangement pitch of the phase shift sections 5a related to the phase grating 5, and an arrangement pitch of detection elements related to the FPD 4. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections 5a, the present invention can change the positional relationship among the multi-slit 3b, the phase grating 5, and the FPD 4.

公开(公告)号：EP3488783B1

公开(公告)日：2020-11-04

申请号：EP17830889.6

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： HORIBA, Akira ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00

公开(公告)号：EP3492016A1

公开(公告)日：2019-06-05

申请号：EP17834007.1

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： SANO, Satoshi ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00 ,  G01N23/04

摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.

公开(公告)号：EP3450967A1

公开(公告)日：2019-03-06

申请号：EP18191150.4

申请日：2018-08-28

申请人： Shimadzu Corporation

发明人： SANO, Satoshi ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  MORIMOTO, Naoki ,  KIMURA, Kenji ,  MIZUSHIMA, Hiroshi

IPC分类号： G01N23/041 ,  A61B6/00 ,  A61B6/03

摘要： The X-ray imaging apparatus (100) is provided with a plurality of gratings including an X-ray source (1) and a first grating (2), a detector (4), a grating rotation mechanism (7) for rotating a plurality of gratings respectively, and an image processor (5) for generating at least a dark field image (13). The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane (XY plane) orthogonal to the optical axis direction (Z-direction).

公开(公告)号：EP3417783B1

公开(公告)日：2020-04-15

申请号：EP18177512.3

申请日：2018-06-13

申请人： Shimadzu Corporation

发明人： HORIBA, Akira ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  MORIMOTO, Naoki

IPC分类号： A61B6/00 ,  G01N23/041

公开(公告)号：EP3449836A1

公开(公告)日：2019-03-06

申请号：EP18191900.2

申请日：2018-08-31

申请人： Shimadzu Corporation

发明人： SANO, Satoshi ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  MORIMOTO, Naoki

IPC分类号： A61B6/12 ,  A61B6/00 ,  B29C70/00 ,  G01N23/20 ,  G01N23/201 ,  A61B6/03 ,  G01N23/046 ,  G01N23/041

摘要： The X-ray imaging apparatus (100) is provided with an X-ray source (1), a plurality of gratings including a first grating (2) and a second grating (3), a detector (4), a rotation mechanism (7) for relatively rotating a subject including a fiber bundle (10) and an imaging system (23), and an image processor (5) for generating a dark field image (13). The image processor is configured to obtain a three-dimensional dark field image (21) of the subject including at least the fiber bundle from a plurality of dark field images captured at a plurality of rotation angles.

公开(公告)号：EP3462166A3

公开(公告)日：2019-04-17

申请号：EP18194139.4

申请日：2018-09-13

申请人： Shimadzu Corporation

发明人： DOKI, Takahiro ,  KIMURA, Kenji ,  SHIRAI, Taro ,  SANO, Satoshi ,  HORIBA, Akira ,  MORIMOTO, Naoki ,  MIZUSHIMA, Hiroshi

IPC分类号： G01N23/04 ,  A61B6/00 ,  G01N23/041

摘要： A radiation phase contrast imaging apparatus (100) is provided with an image signal generation system (3) including an X-ray source (1) and an image signal detector (2), a plurality of gratings including a first grating (4) and a second grating (5), a holder (6) for holding a plurality of gratings in a suspended manner, and a position switching mechanism (8) for switching the relative position of the plurality of gratings with respect to the image signal generation system between the retracted position and the detection position. Either one of the plurality of gratings and the image signal generation system is held by a single holder.

公开(公告)号：EP3417782A1

公开(公告)日：2018-12-26

申请号：EP18175122.3

申请日：2018-05-30

申请人： Shimadzu Corporation

发明人： SANO, Satoshi ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  MORIMOTO, Naoki

IPC分类号： A61B6/00

CPC分类号： A61B6/5235 ,  A61B6/484 ,  A61B6/5264

摘要： The X-ray imaging apparatus (100) is equipped with an image processing unit (5) for performing a position adjustment of a first dark field image (11) and a second dark field image (13) based on a positional difference amount between a first absorption image (10) of an object (T) and a second absorption image (12) of the object.

公开(公告)号：EP3473183A1

公开(公告)日：2019-04-24

申请号：EP17812955.7

申请日：2017-03-15

申请人： Shimadzu Corporation

发明人： TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  HORIBA, Akira

IPC分类号： A61B6/00 ,  G01N23/04

摘要： Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.