公开(公告)号：EP3488783A1

公开(公告)日：2019-05-29

申请号：EP17830889.6

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： HORIBA, Akira ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00

摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

公开(公告)号：EP3488783B1

公开(公告)日：2020-11-04

申请号：EP17830889.6

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： HORIBA, Akira ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  SANO, Satoshi ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00

公开(公告)号：EP3492016A1

公开(公告)日：2019-06-05

申请号：EP17834007.1

申请日：2017-07-10

申请人： Shimadzu Corporation ,  Osaka University

发明人： SANO, Satoshi ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00 ,  G01N23/04

摘要： This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.

公开(公告)号：EP3520697A1

公开(公告)日：2019-08-07

申请号：EP17855414.3

申请日：2017-07-28

申请人： Shimadzu Corporation ,  Osaka University

发明人： SANO, Satoshi ,  TANABE, Koichi ,  YOSHIMUTA, Toshinori ,  KIMURA, Kenji ,  KISHIHARA, Hiroyuki ,  WADA, Yukihisa ,  IZUMI, Takuro ,  SHIRAI, Taro ,  DOKI, Takahiro ,  HORIBA, Akira ,  SHIMURA, Takayoshi ,  WATANABE, Heiji ,  HOSOI, Takuji

IPC分类号： A61B6/00 ,  G01N23/20

摘要： An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit 3b and an arrangement pitch of phase shift sections 5a related to a phase grating 5. A positional relationship among the multi-slit 3b, the phase grating 5, and an FPD 4 is determined based on the arrangement pitch of the slits related to the multi-slit 3b, the arrangement pitch of the phase shift sections 5a related to the phase grating 5, and an arrangement pitch of detection elements related to the FPD 4. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections 5a, the present invention can change the positional relationship among the multi-slit 3b, the phase grating 5, and the FPD 4.