- 专利标题: TUNNELING OXIDE LAYER, N-TYPE DOUBLE-SIDED SOLAR CRYSTALLINE SILICON BATTERY, AND PREPARATION METHODS
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申请号: EP22908852.1申请日: 2022-07-27
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公开(公告)号: EP4254517A1公开(公告)日: 2023-10-04
- 发明人: ZHANG, Ming , MENG, Xiajie , XU, Wenzhou , CHEN, Hao , DENG, Mingzhang , XING, Guoqiang , YAO, Qian
- 申请人: Tongwei Solar (Meishan) Co., Ltd.
- 申请人地址: CN Meishan, Sichuan 620041 No.8-1 Jinxiu Road Xiuwen Town Dongpo District
- 代理机构: Marks & Clerk LLP
- 优先权: CN202111650174 20211230
- 国际公布: WO2023124046 20230706
- 主分类号: H01L31/18
- IPC分类号: H01L31/18 ; H01L21/02 ; H01L31/0216 ; H01L31/068 ; C23C16/40
摘要:
A tunnel oxide layer, an N-type bifacial crystalline silicon solar cell and a method for manufacturing the same are provided, which are relate to the field of crystalline silicon solar cells. The method for manufacturing the tunnel oxide layer includes forming excess -OH on a back side of a silicon wafer, and depositing the tunnel oxide layer on the back side of the silicon wafer by a Plasma Enhanced Atomic Layer Deposition method. The method for manufacturing the N-type bifacial crystalline silicon solar cell can include following steps: performing cleaning, texturing, boron diffusing, and alkaline polishing on an N-type silicon wafer, sequentially forming a P-type doped layer, a passivation layer, and an anti-reflection layer on a front side of the alkaline-polished N-type silicon wafer, and forming a tunnel oxide layer on a back side of the alkaline-polished N-type silicon wafer, followed by forming an N-type doped polysilicon layer, and after annealing, forming an anti-reflection layer. A SiO x layer obtained by the above method can be continuous and dense, and have a fast growth rate, an excellent impurity absorption effect and an excellent blocking effect. Moreover, a thickness of the SiO x layer can be accurate and controllable, and the SiO x layer has pinholes with a high density and a large size after high temperature annealing.
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