Invention Grant
- Patent Title: Structure of semiconductor device with source/drain structures
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Application No.: US15292428Application Date: 2016-10-13
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Publication No.: US10026840B2Publication Date: 2018-07-17
- Inventor: Shahaji B. More , Zheng-Yang Pan , Chun-Chieh Wang , Cheng-Han Lee , Shih-Chieh Chang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L29/417
- IPC: H01L29/417 ; H01L29/78 ; H01L29/08 ; H01L29/267 ; H01L29/36 ; H01L27/092 ; H01L21/8238 ; H01L29/66 ; H01L21/8234

Abstract:
Structures of a semiconductor device are provided. The semiconductor device includes a substrate, a gate structure over the substrate, and a first recess and a second recess in the substrate and at opposite sides of the gate structure. The semiconductor device also includes two source/drain structures over the first recess and the second recess respectively. At least one of the source/drain structures includes a first doped region partially filling in the first recess, a second doped region over the first doped region, and a third doped region over the second doped region. The second doped region contains more dopants than the first doped region or the third doped region.
Public/Granted literature
- US20180108775A1 STRUCTURE OF SEMICONDUCTOR DEVICE WITH SOURCE/DRAIN STRUCTURES Public/Granted day:2018-04-19
Information query
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