Invention Grant
- Patent Title: Method of processing location information and method of processing measurement information including the same
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Application No.: US14876612Application Date: 2015-10-06
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Publication No.: US10040198B2Publication Date: 2018-08-07
- Inventor: Kyoung-Whan Oh , Sung-Chul Go , Eun-Kyung Hong , Dong-Hyun Kim , Jin-Ha Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELETCRONICS CO., LTD.
- Current Assignee: SAMSUNG ELETCRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2014-0191128 20141226
- Main IPC: H01L21/67
- IPC: H01L21/67 ; B25J9/02 ; B25J9/16 ; G01C21/20

Abstract:
A method of processing measurement information in which a determined parameter value is determined at each of a plurality of measurement times including determining a predicted parameter value at each of the measurement times, determining an error range at each of the measurement times based on the predicted parameter value, obtaining a measured parameter value at each of the measurement times, and determining the determined parameter value based on the predicted parameter value, the measured parameter value, and the error range.
Public/Granted literature
Information query
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