Invention Grant
- Patent Title: In-situ stress detector for an electrode and a method of use
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Application No.: US15071734Application Date: 2016-03-16
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Publication No.: US10054501B2Publication Date: 2018-08-21
- Inventor: Ying Liu , Kenzo Oshihara
- Applicant: NISSAN NORTH AMERICA, INC.
- Applicant Address: US TN Franklin
- Assignee: Nissan North America, Inc.
- Current Assignee: Nissan North America, Inc.
- Current Assignee Address: US TN Franklin
- Agency: Young Basile Hanlon & MacFarlane, P.C.
- Main IPC: G01L1/00
- IPC: G01L1/00 ; G01L1/16 ; G01R31/01 ; H01M10/42

Abstract:
A stress detector for detecting an in-situ stress profile of an electrode has a liquid cell, a holder configured to attach to one end of a sample electrode so that the sample electrode is cantilevered in the liquid cell, a piezo sensor comprising a piezo material in the liquid cell and having a movable end configured to contact the sample electrode and a fixed end fixedly engaged within the liquid cell and a measurement sensor in contact with the piezo sensor.
Public/Granted literature
- US20170268940A1 An IN-SITU STRESS DETECTOR FOR AN ELECTRODE AND A METHOD OF USE Public/Granted day:2017-09-21
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