- 专利标题: N-channel gallium nitride transistors
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申请号: US15526735申请日: 2014-12-18
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公开(公告)号: US10056456B2公开(公告)日: 2018-08-21
- 发明人: Han Wui Then , Sansaptak Dasgupta , Marko Radosavljevic , Seung Hoon Sung , Sanaz K. Gardner , Robert S. Chau
- 申请人: INTEL CORPORATION
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Green, Howard & Mughal LLP
- 国际申请: PCT/US2014/071163 WO 20141218
- 国际公布: WO2016/099509 WO 20160623
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L29/08 ; H01L29/778 ; H01L29/423 ; H01L29/20
摘要:
The present description relates to n-channel gallium nitride transistors which include a recessed gate electrode, wherein the polarization layer between the gate electrode and the gallium nitride layer is less than about 1 nm. In additional embodiments, the n-channel gallium nitride transistors may have an asymmetric configuration, wherein a gate-to drain length is greater than a gate-to-source length. In further embodiment, the n-channel gallium nitride transistors may be utilized in wireless power/charging devices for improved efficiencies, longer transmission distances, and smaller form factors, when compared with wireless power/charging devices using silicon-based transistors.
公开/授权文献
- US20180026097A1 N-CHANNEL GALLIUM NITRIDE TRANSISTORS 公开/授权日:2018-01-25
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