- 专利标题： Systems and methods for detecting thermal runaway
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申请号： US14603058申请日： 2015-01-22
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公开(公告)号： US10061331B2公开(公告)日： 2018-08-28
- 发明人: Mehdi Saeidi , Rajat Mittal , Arpit Mittal , Ryan Michael Coutts
- 申请人： QUALCOMM Incorporated
- 申请人地址： US CA San Diego
- 专利权人： QUALCOMM Incorporated
- 当前专利权人： QUALCOMM Incorporated
- 当前专利权人地址： US CA San Diego
- 代理机构： Loza & Loza LLP
- 主分类号： G05D23/00
- IPC分类号： G05D23/00 ; G06F1/32 ; G05D23/19 ; G01K3/08 ; G06F1/20 ; G05B15/02 ; G01K3/10
摘要：
In one embodiment, a method of temperature control comprises receiving temperature readings from a temperature sensor on a chip, calculating one or more second derivatives of temperature with respect to time based on the temperature readings, and determining whether to perform temperature mitigation on the chip based on the one or more calculated second derivatives of temperature.
公开/授权文献
- US20160216719A1 SYSTEMS AND METHODS FOR DETECTING THERMAL RUNAWAY 公开/授权日：2016-07-28
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