Invention Grant
- Patent Title: Early detection of reliability degradation through analysis of multiple physically unclonable function circuit codes
-
Application No.: US14979301Application Date: 2015-12-22
-
Publication No.: US10073138B2Publication Date: 2018-09-11
- Inventor: Suraj Sindia , Robert Kwasnick , Dhruv Singh
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Compass IP Law, PC
- Main IPC: H04L9/00
- IPC: H04L9/00 ; G01R31/317 ; G01R31/3177 ; H04L9/08 ; H04L9/32
Abstract:
An apparatus is described that includes a plurality of circuits each designed to exhibit a unique signature code that is determined from manufacturing tolerances associated with a manufacturing process used to manufacture the circuits. The apparatus also includes error circuitry to determine an error has arisen based on a change in signature codes from the plurality of circuits.
Public/Granted literature
Information query
