- 专利标题: High-resolution microscope and image splitter arrangment
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申请号: US15087177申请日: 2016-03-31
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公开(公告)号: US10078206B2公开(公告)日: 2018-09-18
- 发明人: Thomas Kalkbrenner , Michael Goelles
- 申请人: Carl Zeiss Microscopy GmbH
- 申请人地址: DE Jena
- 专利权人: Carl Zeiss Microscopy GmbH
- 当前专利权人: Carl Zeiss Microscopy GmbH
- 当前专利权人地址: DE Jena
- 代理机构: Duane Morris LLP
- 优先权: DE102009060490 20091222
- 主分类号: G02B21/36
- IPC分类号: G02B21/36 ; G02B21/00 ; G01N21/64 ; G02B21/18 ; G02B17/02 ; G02B21/16 ; G02B27/10 ; G02B27/14 ; G02B27/58 ; G02B7/38 ; G02B21/24
摘要:
The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver. At least the second part of the detection light runs in an optical element having an optical density that is increased as compared with the first detection beam path, in order to lengthen the optical path length, and the optical element is designed to be displaceable at an angle, preferably perpendicular, to the optical axis of the first detection beam path in order to adjust the optical path length, and has flat surfaces, at least on the light entry and light exit side thereof; a prism is provided, preferably a glass prism, preferably at least in the second detection beam path after a first beam deflection, for deflection in a direction parallel to the first detection beam path, in order to increase the path length and for reverse deflection.
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