Invention Grant
- Patent Title: Multiple timebase sampling scope
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Application No.: US15167550Application Date: 2016-05-27
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Publication No.: US10079639B2Publication Date: 2018-09-18
- Inventor: Jan P. Peeters Weem
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Miller Nash Graham & Dunn
- Agent Kevin D. Dothager
- Main IPC: H04B10/077
- IPC: H04B10/077 ; H03L7/08 ; H04J3/06 ; H04J14/08 ; H04L7/00 ; G01R13/02

Abstract:
A test and measurement instrument includes a first input port and a second input port that receive a first input signal modulated according to a first clock signal and a second input signal modulated according to a second clock signal, respectively. The first clock signal and the second clock signal may be asynchronous. The instrument also includes a phase reference that generates clock data for the second clock signal. The instrument includes a processor that determines time bases for the input signals that comprise different rates based on the received and/or generated clock data. The instrument also includes a display coupled to the processor. The display concurrently displays the first input signal in a first graticule according to the first time base and the second input signal in a second graticule according to the second time base.
Public/Granted literature
- US20170346555A1 MULTIPLE TIMEBASE SAMPLING SCOPE Public/Granted day:2017-11-30
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