公开(公告)号：US20170346555A1

公开(公告)日：2017-11-30

申请号：US15167550

申请日：2016-05-27

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem

IPC: H04B10/077 ,  H04J14/08 ,  H04J3/06 ,  H04L7/00 ,  H03L7/08

CPC classification number: H04B10/0775 ,  G01R13/0236 ,  H03L7/0807 ,  H04J3/06 ,  H04J14/08 ,  H04L7/0087

Abstract: A test and measurement instrument includes a first input port and a second input port that receive a first input signal modulated according to a first clock signal and a second input signal modulated according to a second clock signal, respectively. The first clock signal and the second clock signal may be asynchronous. The instrument also includes a phase reference that generates clock data for the second clock signal. The instrument includes a processor that determines time bases for the input signals that comprise different rates based on the received and/or generated clock data. The instrument also includes a display coupled to the processor. The display concurrently displays the first input signal in a first graticule according to the first time base and the second input signal in a second graticule according to the second time base.

公开(公告)号：US09909907B2

公开(公告)日：2018-03-06

申请号：US14519370

申请日：2014-10-21

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem ,  Klaus M. Engenhardt ,  Laszlo J. Dobos

IPC: G01D18/00 ,  G01R13/02 ,  G01R31/317

CPC classification number: G01D18/00 ,  G01R13/0272 ,  G01R31/31709

Abstract: A method for correcting a timing error in a test and measurement instrument. The method includes receiving a clock signal at each of four samplers. The first clock signal is sampled at the first sampler at a first phase, the second clock signal is sampled at the second sampler at a second phase that is 90 degrees offset from the first phase, the third clock signal is sampled at the third sampler at a third phase that is 45 degrees offset from the first phase, and the fourth clock signal is sampled at the fourth sampler at a fourth phase that is 90 degrees offset from the third phase. Each of the outputs from the samplers are digitized and a timing correction is calculated based on the digitized outputs from the digitized outputs.

公开(公告)号：US12019098B2

公开(公告)日：2024-06-25

申请号：US16883755

申请日：2020-05-26

Applicant: Tektronix, Inc.

Inventor： Noah Brummer ,  Andy K. Lim ,  Jan P. Peeters Weem

IPC: G01R13/34 ,  G01R13/02 ,  H04L27/233

CPC classification number: G01R13/345 ,  G01R13/0272 ,  H04L27/233

Abstract: An equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal under test, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisition unit configured to acquire a portion of the signal under test every optimized trigger holdoff period.

公开(公告)号：US20190285666A1

公开(公告)日：2019-09-19

申请号：US16119248

申请日：2018-08-31

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem

IPC: G01R1/073 ,  G01R1/04 ,  G01R1/067

Abstract: A test and measurement management device, including a request queue to receive a request from a request module, the request including an identification of a device under test and a requested measurement and one or more processors. The one or more processors are configured to receive the request from the request queue, generate a command to instruct an optical switch to select a port associated with the device under test based on the identification of the device under test, determine the requested measurement from the request, and based on the requested measurement and the identification of the device under test, generate instructions to configure a test and measurement instrument to perform the requested measurement.

公开(公告)号：US10079639B2

公开(公告)日：2018-09-18

申请号：US15167550

申请日：2016-05-27

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem

IPC: H04B10/077 ,  H03L7/08 ,  H04J3/06 ,  H04J14/08 ,  H04L7/00 ,  G01R13/02

CPC classification number: H04B10/0775 ,  G01R13/0236 ,  H03L7/0807 ,  H04J3/06 ,  H04J14/08 ,  H04L7/0087

Abstract: A test and measurement instrument includes a first input port and a second input port that receive a first input signal modulated according to a first clock signal and a second input signal modulated according to a second clock signal, respectively. The first clock signal and the second clock signal may be asynchronous. The instrument also includes a phase reference that generates clock data for the second clock signal. The instrument includes a processor that determines time bases for the input signals that comprise different rates based on the received and/or generated clock data. The instrument also includes a display coupled to the processor. The display concurrently displays the first input signal in a first graticule according to the first time base and the second input signal in a second graticule according to the second time base.

公开(公告)号：US20170023628A1

公开(公告)日：2017-01-26

申请号：US14803790

申请日：2015-07-20

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem

IPC: G01R27/28 ,  G01R35/00

CPC classification number: G01R27/28 ,  G01R31/06 ,  G01R31/31709 ,  G01R35/005

Abstract: A test and measurement instrument including an input configured to receive a reflected and/or transmitted pulse signal from a device under test, a reference clock input configured to receive a reference signal, the reference signal being asynchronous from the reflected pulse signal, a phase reference module configured to acquire samples of the reference signal, a sampling module configured to acquire samples of the reflected pulse signal; and a controller configured to determine a scattering parameter of the device under test based on the acquired samples of the reference signal and the acquired samples of the reflected pulse signal.

Abstract translation: 一种测试和测量仪器，包括被配置为从被测器件接收反射和/或发射的脉冲信号的输入端，被配置为接收参考信号的参考时钟输入，所述参考信号与所述反射脉冲信号异步，相位参考 被配置为获取所述参考信号的采样的模块，被配置为获取所述反射脉冲信号的采样的采样模块; 以及控制器，被配置为基于所获取的参考信号的样本和所获取的反射脉冲信号的样本来确定被测器件的散射参数。

公开(公告)号：US20160033309A1

公开(公告)日：2016-02-04

申请号：US14519370

申请日：2014-10-21

Applicant: Tektronix, Inc.

Inventor： Jan P. Peeters Weem ,  Klaus M. Engenhardt ,  Laszlo J. Dobos

IPC: G01D18/00

CPC classification number: G01D18/00 ,  G01R13/0272 ,  G01R31/31709

Abstract: A method for correcting a timing error in a test and measurement instrument. The method includes receiving a clock signal at each of four samplers. The first clock signal is sampled at the first sampler at a first phase, the second clock signal is sampled at the second sampler at a second phase that is 90 degrees offset from the first phase, the third clock signal is sampled at the third sampler at a third phase that is 45 degrees offset from the first phase, and the fourth clock signal is sampled at the fourth sampler at a fourth phase that is 90 degrees offset from the third phase. Each of the outputs from the samplers are digitized and a timing correction is calculated based on the digitized outputs from the digitized outputs.

Abstract translation: 一种用于校正测试和测量仪器中的定时误差的方法。 该方法包括在四个采样器中的每一个处接收时钟信号。 第一时钟信号在第一采样器处以第一相采样，第二时钟信号在第二采样器以与第一相位偏移90度的第二相位采样，第三时钟信号在第三采样器处采样， 第三相位与第一相位偏移45度，第四时钟信号在第四采样器处以与第三相位偏移90度的第四相位被采样。 来自采样器的每个输出被数字化，并且基于来自数字化输出的数字化输出来计算定时校正。