- Patent Title: Word line defect detection and handling for a data storage device
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Application No.: US13928774Application Date: 2013-06-27
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Publication No.: US10083069B2Publication Date: 2018-09-25
- Inventor: Seungjune Jeon , Idan Alrod , Eran Sharon , Dana Lee
- Applicant: SANDISK TECHNOLOGIES LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Michael Best & Friedrich LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/07 ; G11C29/02 ; G11C16/34

Abstract:
A data storage device includes a non-volatile memory and a controller. The non-volatile memory includes a word line coupled to a plurality of storage elements. A method includes detecting a condition associated with a defect in the word line. A first subset of the plurality of storage elements and a second subset of the plurality of storage elements are determined based on an estimated location of the defect. The method further includes determining a first read threshold for the first subset and a second read threshold for the second subset.
Public/Granted literature
- US20150006975A1 WORD LINE DEFECT DETECTION AND HANDLING FOR A DATA STORAGE DEVICE Public/Granted day:2015-01-01
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