Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.