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公开(公告)号：US20180189522A1
公开(公告)日：2018-07-05
申请号：US15396561
申请日：2016-12-31
Applicant: Intel Corporation
Inventor： Robert F. Kwasnick , Suraj Sindia , Clark N. Vandam , Balkaran Gill
CPC classification number: G06F21/70 , G06F21/10 , G06F21/629 , G06F21/88 , G06N3/02 , H04L12/2803 , H04L12/2816 , H04L12/2818 , H04L12/2825 , H04L12/2827 , H04L29/08099 , H04L43/065 , H04L43/08 , H04Q9/00
Abstract: Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.
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公开(公告)号：US10078544B2
公开(公告)日：2018-09-18
申请号：US14975751
申请日：2015-12-19
Applicant: Intel Corporation
Inventor： Clark N. Vandam , Balkaran Gill , Junho Song , Suriya Suriya Ashok Kumar , Kasyap Pasumarthi
CPC classification number: G06F11/0793 , G06F11/0721 , G06F11/0751 , G06F11/079 , G06F11/2236 , G06F11/24 , G06F11/27
Abstract: An apparatus and method are described for an on-chip reliability controller. For example, one embodiment of a processor comprises: a set of one or more cores to execute instructions and process data; a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations; a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor; and a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.
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公开(公告)号：US10592331B2
公开(公告)日：2020-03-17
申请号：US16110381
申请日：2018-08-23
Applicant: Intel Corporation
Inventor： Clark N. Vandam , Balkaran Gill , Junho Song , Suriya Ashok Kumar , Kasyap Pasumarthi
Abstract: An apparatus and method are described for an on-chip reliability controller. For example, one embodiment of a processor comprises: a set of one or more cores to execute instructions and process data; a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations; a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor; and a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.
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公开(公告)号：US10114981B2
公开(公告)日：2018-10-30
申请号：US15396561
申请日：2016-12-31
Applicant: Intel Corporation
Inventor： Robert F. Kwasnick , Suraj Sindia , Clark N. Vandam , Balkaran Gill
Abstract: Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.
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