Invention Grant
- Patent Title: Sample test method, microfluidic device, and test device
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Application No.: US15891632Application Date: 2018-02-08
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Publication No.: US10126232B2Publication Date: 2018-11-13
- Inventor: Sung Ha Park , Sang Bum Park , Beom Seok Lee , Kui Hyun Kim , Joo Hee Park , Kyung Mi Song , Euy Hyun Cho , Ha Na Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0104285 20140812; KR10-2014-0194091 20141230
- Main IPC: G01N21/31
- IPC: G01N21/31 ; G01N21/05 ; G01N21/27 ; G01N21/01 ; G01N33/49 ; G01N33/08 ; G01N35/08 ; B01L3/00

Abstract:
A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
Public/Granted literature
- US20180180536A1 SAMPLE TEST METHOD, MICROFLUIDIC DEVICE, AND TEST DEVICE Public/Granted day:2018-06-28
Information query
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