Invention Grant
- Patent Title: Field-effect transistor
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Application No.: US15890303Application Date: 2018-02-06
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Publication No.: US10128366B2Publication Date: 2018-11-13
- Inventor: Yu-Ying Lin , Kuan Hsuan Ku , I-Cheng Hu , Chueh-Yang Liu , Shui-Yen Lu , Yu Shu Lin , Chun Yao Yang , Yu-Ren Wang , Neng-Hui Yang
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORPORATION
- Current Assignee: UNITED MICROELECTRONICS CORPORATION
- Current Assignee Address: TW Hsinchu
- Agent Winston Hsu
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/78 ; H01L21/225 ; H01L29/06 ; H01L21/768 ; H01L21/311 ; H01L29/417 ; H01L29/165 ; H01L27/092

Abstract:
A semiconductor device includes a semiconductor substrate, a gate structure formed over the semiconductor substrate, and an epitaxial structure formed partially within the semiconductor substrate. The gate structure includes a gate dielectric layer formed over the semiconductor substrate, a gate electrode formed over the gate dielectric layer, and a spacer formed on side surfaces of the gate dielectric layer and the gate electrode. A laterally extending portion of the epitaxial structure extends laterally at an area below a top surface of the semiconductor substrate in a direction toward an area below the gate structure. A lateral end of the laterally extending portion is below the spacer.
Public/Granted literature
- US20180158943A1 FIELD-EFFECT TRANSISTOR Public/Granted day:2018-06-07
Information query
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