Invention Grant
- Patent Title: Estimating leakage currents based on rates of temperature overages or power overages
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Application No.: US14021279Application Date: 2013-09-09
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Publication No.: US10151786B2Publication Date: 2018-12-11
- Inventor: Ashish Jain , Alexander J. Branover
- Applicant: Advanced Micro Devices, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G06F1/20 ; G06F1/32
Abstract:
An operating point of one or more components in a processing device may be set using a leakage current estimated based on at least one of a rate of temperature overages or a rate of power overages. In some embodiments, a power management controller may be used to set an operating point of one or more components in the processing device based on at least one of a rate of temperature overages or a rate of power overages for the component(s).
Public/Granted literature
- US20150073611A1 ESTIMATING LEAKAGE CURRENTS BASED ON RATES OF TEMPERATURE OVERAGES OR POWER OVERAGES Public/Granted day:2015-03-12
Information query
