Invention Grant
- Patent Title: Integrated RF circuit with phase-noise test capability
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Application No.: US16105431Application Date: 2018-08-20
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Publication No.: US10205541B2Publication Date: 2019-02-12
- Inventor: Oliver Frank , Guenter Haider , Jochen O. Schrattenecker
- Applicant: Infineon Technologies AG
- Applicant Address: DE
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE
- Agency: Design IP
- Priority: DE102016115785 20160825
- Main IPC: H04B17/00
- IPC: H04B17/00 ; G01R31/317 ; H04B15/00 ; H04B17/14

Abstract:
An integrated circuit is described herein. According to one or more embodiments, the integrated circuit includes a local oscillator with a voltage-controlled oscillator (VCO) that generates a local oscillator signal. Further, the integrated circuit includes a frequency divider coupled to the VCO downstream thereof. The frequency divider provides a frequency-divided local oscillator signal by reducing the frequency of the local oscillator signal by a constant factor. A first test pad of the integrated circuit is configured to receive a reference oscillator signal. Further, the integrated circuit includes a first mixer that receives the reference oscillator signal and the frequency-divided local oscillator signal to down-convert the frequency-divided local oscillator signal.
Public/Granted literature
- US20180359035A1 INTEGRATED RF CIRCUIT WITH PHASE-NOISE TEST CAPABILITY Public/Granted day:2018-12-13
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