Integrated RF circuit with phase-noise test capability

    公开(公告)号:US10090939B2

    公开(公告)日:2018-10-02

    申请号:US15685542

    申请日:2017-08-24

    Abstract: An integrated circuit is described herein. According to one or more embodiments, the integrated circuit includes a local oscillator with a voltage-controlled oscillator (VCO) that generates a local oscillator signal. Further, the integrated circuit includes a frequency divider coupled to the VCO downstream thereof. The frequency divider provides a frequency-divided local oscillator signal by reducing the frequency of the local oscillator signal by a constant factor. A first test pad of the integrated circuit is configured to receive a reference oscillator signal. Further, the integrated circuit includes a first mixer that receives the reference oscillator signal and the frequency-divided local oscillator signal to down-convert the frequency-divided local oscillator signal.

    Integrated RF circuit with phase-noise test capability

    公开(公告)号:US10205541B2

    公开(公告)日:2019-02-12

    申请号:US16105431

    申请日:2018-08-20

    Abstract: An integrated circuit is described herein. According to one or more embodiments, the integrated circuit includes a local oscillator with a voltage-controlled oscillator (VCO) that generates a local oscillator signal. Further, the integrated circuit includes a frequency divider coupled to the VCO downstream thereof. The frequency divider provides a frequency-divided local oscillator signal by reducing the frequency of the local oscillator signal by a constant factor. A first test pad of the integrated circuit is configured to receive a reference oscillator signal. Further, the integrated circuit includes a first mixer that receives the reference oscillator signal and the frequency-divided local oscillator signal to down-convert the frequency-divided local oscillator signal.

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