Invention Grant
- Patent Title: Sputtering apparatus and method of discriminating state thereof
-
Application No.: US15507920Application Date: 2016-06-10
-
Publication No.: US10233536B2Publication Date: 2019-03-19
- Inventor: Shinya Nakamura , Yoshinori Fujii
- Applicant: ULVAC, INC.
- Applicant Address: JP Kanagawa
- Assignee: ULVAC, INC.
- Current Assignee: ULVAC, INC.
- Current Assignee Address: JP Kanagawa
- Agency: Cermak Nakajima & McGowan LLP
- Agent Tomoko Nakajima
- Priority: JP2015-162484 20150820
- International Application: PCT/JP2016/002814 WO 20160610
- International Announcement: WO2017/029771 WO 20170223
- Main IPC: C23C14/34
- IPC: C23C14/34 ; C23C14/08 ; C23C14/35 ; C23C14/52 ; C23C14/54 ; H01J37/32 ; H01J37/34 ; G01L13/00

Abstract:
A method of discriminating a state of a sputtering apparatus in which, by sputtering a target, a film is formed on a substrate disposed to lie opposite to the target, the discrimination being made, prior to the film formation on the substrate, as to whether an atmosphere in the vacuum chamber is in a state fit for film formation. As the sputtering apparatus, use is made of one provided inside the vacuum chamber with an isolated space which is isolated from the vacuum chamber by an isolating means (6, 71˜73), the isolated space being for the target and the substrate to lie therein opposite to each other, the sputtering apparatus being so arranged that the isolated space is evacuated accompanied by the evacuation in the vacuum chamber. The vacuum chamber is evacuated to a predetermined set pressure and a gas is introduced therein in this state.
Public/Granted literature
- US20170283940A1 Sputtering Apparatus and Method of Discriminating State Thereof Public/Granted day:2017-10-05
Information query
IPC分类: