Invention Grant
- Patent Title: Capacitive mismatch measurement
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Application No.: US15836976Application Date: 2017-12-11
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Publication No.: US10236900B1Publication Date: 2019-03-19
- Inventor: Steven John Loveless , Yuguo Wang , Tathagata Chatterjee , Robert Stanley Grondalski
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: H03K5/24
- IPC: H03K5/24 ; H03M1/10 ; G01R27/26 ; H03K21/08

Abstract:
An analog-to-digital converter (ADC) comprising successive approximation circuitry, a capacitive analog-to-digital converter (CDAC), and capacitor mismatch measurement circuitry. The successive approximation circuitry is configured to control conversion of an analog signal to a digital value. The CDAC is coupled to the successive approximation circuitry. The CDAC includes a plurality of capacitors. The capacitor mismatch measurement circuitry is coupled to the CDAC. The capacitor mismatch measurement circuitry includes a first oscillator circuit, a second oscillator circuit, and counter circuitry. The first oscillator circuit is configured to oscillate at a frequency determined by a capacitance of one of the capacitors. The second oscillator circuit is configured to generate a predetermined time interval. The counter circuitry is configured to count a number of cycles of oscillation of the first oscillator in the predetermined time interval.
Information query
IPC分类: