- 专利标题: Capacitive mismatch measurement
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申请号: US15836976申请日: 2017-12-11
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公开(公告)号: US10236900B1公开(公告)日: 2019-03-19
- 发明人: Steven John Loveless , Yuguo Wang , Tathagata Chatterjee , Robert Stanley Grondalski
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: US TX Dallas
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: US TX Dallas
- 代理商 John R. Pessetto; Charles A. Brill; Frank D. Cimino
- 主分类号: H03K5/24
- IPC分类号: H03K5/24 ; H03M1/10 ; G01R27/26 ; H03K21/08
摘要:
An analog-to-digital converter (ADC) comprising successive approximation circuitry, a capacitive analog-to-digital converter (CDAC), and capacitor mismatch measurement circuitry. The successive approximation circuitry is configured to control conversion of an analog signal to a digital value. The CDAC is coupled to the successive approximation circuitry. The CDAC includes a plurality of capacitors. The capacitor mismatch measurement circuitry is coupled to the CDAC. The capacitor mismatch measurement circuitry includes a first oscillator circuit, a second oscillator circuit, and counter circuitry. The first oscillator circuit is configured to oscillate at a frequency determined by a capacitance of one of the capacitors. The second oscillator circuit is configured to generate a predetermined time interval. The counter circuitry is configured to count a number of cycles of oscillation of the first oscillator in the predetermined time interval.
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