Invention Grant
- Patent Title: Substrate processing method and recording medium
-
Application No.: US15443687Application Date: 2017-02-27
-
Publication No.: US10242878B2Publication Date: 2019-03-26
- Inventor: Tomonari Urano , Kyohei Noguchi , Osamu Yokoyama , Takashi Kobayashi , Satoshi Wakabayashi , Takashi Sakuma
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Priority: JP2016-036013 20160226
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/285 ; H01L21/67 ; H01L21/673

Abstract:
A substrate processing method is for forming a metal film on a target substrate by using a plasma. The method includes loading a target substrate having a silicon-containing layer on a surface thereof into a processing chamber which is pre-coated by a film containing a metal, introducing hydrogen gas and a gaseous compound of the metal and halogen into the processing chamber, generating a plasma, and forming a metal film on the target substrate. The method further includes performing a first reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, unloading the target substrate from the processing chamber, performing a second reduction process of forming an atmosphere of a plasma obtained by activating hydrogen gas in the processing chamber, and loading a next target substrate into the processing chamber.
Public/Granted literature
- US20170250086A1 SUBSTRATE PROCESSING METHOD AND RECORDING MEDIUM Public/Granted day:2017-08-31
Information query
IPC分类: